High resolution X-ray diffraction study of defect structures produced by high d.c. electric fields in silicon single crystals
1987 ◽
Vol 85
◽
pp. 147-156
◽
Keyword(s):
2002 ◽
Vol 14
(29)
◽
pp. 7035-7043
◽
Keyword(s):
2010 ◽
Vol 66
(a1)
◽
pp. s11-s11
1997 ◽
Vol 134
(1)
◽
pp. 132-137
◽
2010 ◽
Vol 66
(a1)
◽
pp. s55-s56
Keyword(s):