On a new method for measuring the charge carriers drift mobility in high resistivity silicon
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1988 ◽
Vol 49
(C4)
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pp. C4-363-C4-366
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2003 ◽
Vol 512
(1-2)
◽
pp. 199-206
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2010 ◽
Vol 58
(3)
◽
pp. 706-713
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