Experimental determination of the minority carrier lifetime in PbTe p−n junctions

Solid State Communications ◽

10.1016/0038-1098(76)91308-9 ◽

1976 ◽

Vol 20 (9) ◽

pp. 929-931 ◽

Author(s):

K. Lischka ◽

W. Huber ◽

H. Heinrich

Keyword(s):

Experimental Determination ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime

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Experimental determination of minority‐carrier lifetime and recombination mechanisms inp‐type Hg1−xCdxTe

Journal of Applied Physics ◽

10.1063/1.329421 ◽

1981 ◽

Vol 52 (8) ◽

pp. 5182-5194 ◽

Author(s):

D. L. Polla ◽

S. P. Tobin ◽

M. B. Reine ◽

A. K. Sood

Keyword(s):

Experimental Determination ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime

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Experimental determination of minority carrier lifetime in solar cells using transient measurements

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/20/6/012 ◽

1987 ◽

Vol 20 (6) ◽

pp. 762-765 ◽

Author(s):

P Mialhe ◽

G Sissoko ◽

M Kane

Keyword(s):

Solar Cells ◽

Experimental Determination ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Transient Measurements

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Experimental determination of minority carrier lifetime and recombination mechanisms in MCT photovoltaic detectors

2012 12th International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) ◽

10.1109/nusod.2012.6316496 ◽

2012 ◽

Author(s):

Haoyang Cui ◽

Naiyun Tang ◽

Zhong Tang

Keyword(s):

Experimental Determination ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Photovoltaic Detectors

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Experimental determination of the effective minority carrier lifetime in the operation of a quantum-well n-p-n heterojunction bipolar light-emitting transistor of varying base quantum-well design and doping

Applied Physics Letters ◽

10.1063/1.2759263 ◽

2007 ◽

Vol 91 (3) ◽

pp. 033505 ◽

Author(s):

H. W. Then ◽

M. Feng ◽

N. Holonyak ◽

C. H. Wu

Keyword(s):

Quantum Well ◽

Experimental Determination ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Light Emitting ◽

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Use of transient capacitance measurements for direct determination of minority‐carrier lifetime in low‐doped metal‐oxide‐semiconductor structures

Applied Physics Letters ◽

10.1063/1.95008 ◽

1984 ◽

Vol 45 (1) ◽

pp. 52-53 ◽

Author(s):

U. Efron ◽

P. O. Braatz

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Direct Determination ◽

Minority Carrier Lifetime ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Capacitance Measurements ◽

Semiconductor Structures ◽

Transient Capacitance

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Determination of minority‐carrier lifetime and surface recombination velocity by optical‐beam‐induced‐current measurements at different light wavelengths

Journal of Applied Physics ◽

10.1063/1.344161 ◽

1989 ◽

Vol 66 (7) ◽

pp. 3060-3065 ◽

Author(s):

Th. Flohr ◽

R. Helbig

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Optical Beam ◽

Surface Recombination Velocity ◽

Induced Current ◽

Recombination Velocity ◽

Optical Beam Induced Current

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Determination of Minority Carrier Lifetime of Holes in Diamond p-i-n Diodes Using Reverse Recovery Method

IEEE Electron Device Letters ◽

10.1109/led.2018.2804978 ◽

2018 ◽

Vol 39 (4) ◽

pp. 552-555 ◽

Author(s):

Maitreya Dutta ◽

Saptarshi Mandal ◽

Raghuraj Hathwar ◽

Alec M. Fischer ◽

Franz A. M. Koeck ◽

...

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

Recovery Method

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Determination of minority-carrier lifetime and recombination currents in solar cells, from high frequency response of a bipolar JFET structure

10.1109/pvsc.1988.105766 ◽

1988 ◽

Author(s):

G. Vitale ◽

P. Spirito

Keyword(s):

Solar Cells ◽

Frequency Response ◽

High Frequency ◽

Carrier Lifetime ◽

Minority Carrier ◽

Minority Carrier Lifetime ◽

High Frequency Response

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Determination of effective surface recombination velocity and minority-carrier lifetime in high-efficiency Si solar cells

Vacuum ◽

10.1016/0042-207x(85)90245-3 ◽

1985 ◽

Vol 35 (8) ◽

pp. 340

Keyword(s):

High Efficiency ◽

Carrier Lifetime ◽

Minority Carrier ◽

Surface Recombination ◽

Minority Carrier Lifetime ◽

Surface Recombination Velocity ◽

Effective Surface ◽

Si Solar Cells ◽

Recombination Velocity

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Study of Photoluminescence Decay by Time-correlated Single Photon Counting for the Determination of the Minority-carrier Lifetime in Silicon

Energy Procedia ◽

10.1016/j.egypro.2014.08.091 ◽

2014 ◽

Vol 55 ◽

pp. 121-127 ◽

Author(s):

Stéphanie Parola ◽

Mehdi Daanoune ◽

Alexandru Focsa ◽

Bachir Semmache ◽

Erwann Picard ◽

...

Keyword(s):

Carrier Lifetime ◽

Minority Carrier ◽

Single Photon ◽

Photon Counting ◽

Minority Carrier Lifetime ◽

Single Photon Counting ◽

Photoluminescence Decay

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