2.23 Experimental determination of the temperature effect on the accuracy of continuous thickness measurements on thin evaporated films, by means of a quartz oscillator

Vacuum ◽  
1967 ◽  
Vol 17 (6) ◽  
pp. 334
Author(s):  
HK Pulker
1999 ◽  
Vol 96 (6) ◽  
pp. 1111-1116 ◽  
Author(s):  
E. Falcon ◽  
S. Fauve ◽  
C. Laroche

1974 ◽  
Author(s):  
G. E. Robinson ◽  
Frank W. Schmidt ◽  
H. R. Block ◽  
G. Green

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