A new method for thin-film thickness measurement using PIXE
1989 ◽
Vol 43
(2)
◽
pp. 203-209
◽
Keyword(s):
1974 ◽
Vol 121
(2)
◽
pp. 253-258
◽
Keyword(s):
2010 ◽
Vol 283
(20)
◽
pp. 3989-3993
◽
Keyword(s):
Keyword(s):
1969 ◽
Vol 2
(1)
◽
pp. 111-112
Keyword(s):
Keyword(s):