Recent progress in refractory-metal silicide formation by ion beam mixing and its applications to VLSL

Author(s):  
Hidekazu Okabayashi
1985 ◽  
Vol 47 (7) ◽  
pp. 688-691 ◽  
Author(s):  
D. L. Kwong ◽  
D. C. Meyers ◽  
N. S. Alvi ◽  
L. W. Li ◽  
E. Norbeck

Author(s):  
Ning Yu ◽  
Zuyao Zhou ◽  
Wei Zhou ◽  
Shichang Tsou ◽  
Dezhang Zhu

1990 ◽  
Vol 26 (6) ◽  
pp. 265-268 ◽  
Author(s):  
S. A. Agamy ◽  
M. Y. Khalil ◽  
A. A. Badawi

1985 ◽  
Vol 57 (6) ◽  
pp. 1890-1894 ◽  
Author(s):  
B‐Y. Tsaur ◽  
C. K. Chen ◽  
C. H. Anderson ◽  
D. L. Kwong

1986 ◽  
Vol 74 ◽  
Author(s):  
K. Kohlhof ◽  
S. Mantl ◽  
B. Stritzker

AbstractIon beam mixing experiments of Ti-Si layers have been performed with Kr ions of 250 keV energy and doses ranging from 7 1015 to 7 1016 cm-2 at temperatures between liquid nitrogen temperature and 450°C. At substrate temperatures below 120°C no silicide formation could be detected. Only weak mixing at the Ti-Si interface is observed. At temperatures above 120°C the formation of TiSi2 could be verified by Rutherford backscattering and X-ray diffractometry. Layers of TiSi2 produced by ion beam mixing show smooth surfaces in contrast to those prepared by conventional furnace annealing. Those display rough surfaces and interfaces.


Sign in / Sign up

Export Citation Format

Share Document