The changes of the work function (Φ) and the secondary electron
emission (SEE) of oxygen covered polycrystalline tungsten occurring
after ion sputtering and heat treatments have been investigated. The
chemical composition was analyzed by X-ray photoelectron spectroscopy
(XPS), and the electron emission properties by work function
spectroscopy (WFS). We observed in what manner the chemical changes of
the surface are reflected in the work function and SEE. The
simultaneous change of Φ and SEE in the case of oxygen covered
tungsten have been pointed out and a direct relationship between them
can be supposed.