High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systems

1994 ◽  
Vol 54 (2-4) ◽  
pp. 156-165 ◽  
Author(s):  
L.J. Chen ◽  
J.M. Liang ◽  
C.S. Liu ◽  
W.Y. Hsieh ◽  
J.H. Lin ◽  
...  
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