High-resolution transmission electron microscopy investigation of interfaces in metal-silicon systems
1984 ◽
Vol 55
(3)
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pp. 337-343
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2003 ◽
Vol 64
(11)
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pp. 2097-2103
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1988 ◽
Vol 57
(6)
◽
pp. 955-969
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2003 ◽
Vol 240-242
◽
pp. 509-512
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