High resolution X-ray diffraction and transmission electron microscopy investigation on As and P incorporation in MOCVD and CBE grown In(GaAs)P/InP 'false' multi quantum wells

2002 ◽  
Author(s):  
C. Ferrari ◽  
L. Lazzarini ◽  
G. Salviati ◽  
L. Gastaldi ◽  
F. Taiarol ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Resolution ◽  
Quantum Wells ◽  
Transmission Electron Microscopy Investigation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Microscopy Investigation ◽  
Electron Microscopy Investigation
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