Stark width and shift dependence on the ionization potential

The existence of the Stark width dependence on the upper-level ionization potential of the quantum transition have been presented for the four types of transitions (4s? - 4p?, 4p? - 4d?, 4p - 5s, 3d - 4p?) in the singly ionized argon spectrum (Ar II). On the basis of established regularities the Stark width values for 6 spectral lines, not measured or calculated before, have been predicted. Critical analysis of the existing experimental Stark width data are, also, given.

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Stark Width Regularities within Beryllium Spectral Series

Publications of the Astronomical Society of Australia ◽

10.1071/as11014 ◽

2011 ◽

Vol 28 (4) ◽

pp. 281-289 ◽

Cited By ~ 7

Author(s):

I. P. Dojčinović ◽

I. Tapalaga ◽

J. Purić

Keyword(s):

Fine Structure ◽

Ionization Potential ◽

Electron Impact ◽

Spectral Lines ◽

Spectral Series ◽

Stark Broadening ◽

Influence Of Temperature ◽

Influence Of Temperature On ◽

Upper Level ◽

Stark Width

AbstractThe dependences of Stark width on the upper-level ionization potential within different series of the neutral beryllium spectral lines have been studied. The dependences previously observed for electron impact contribution to the Stark widths were also obtained for the proton impact contribution. The emphasis is on the fine structure influence on the studied Stark parameter dependences. The influence of temperature on the dependences of Stark width parameters has been demonstrated. The relations found can be used in both cases for prediction of new Stark broadening data, thus avoiding much more complicated procedures.

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Stark Widths Regularities Within: ns-np, np-ns, np-nd, nd-np and nd-nf Spectral Series of Potassium Isoelectronic Sequence

Atoms ◽

10.3390/atoms7040099 ◽

2019 ◽

Vol 7 (4) ◽

pp. 99

Author(s):

Nora Trklja ◽

Ivan P. Dojčinović ◽

Irinel Tapalaga ◽

Jagoš Purić

Keyword(s):

Experimental Data ◽

Data Processing ◽

Ionization Potential ◽

Electron Density ◽

Spectral Series ◽

Isoelectronic Sequence ◽

Electron Density And Temperature ◽

Upper Level ◽

Stark Width

Results presented in this paper show a regular behaviour of Stark widths within the studied spectral series of potassium isoelectronic sequence. These regularities have been found and verified on the basis of the existing theoretical and experimental data being normalized for the same plasma conditions (chosen electron density and temperature). Using the available set of data the corresponding formulas expressing the Stark widths of the lines originated from the spectral series studied here as a function of the upper-level ionization potential and the rest core charge of the emitter seeing by the electron undergoing transition, are obtained here. Well established and verified dependence is used to calculate Stark width data needed but not available so far. For the purposes of the operation with a large number of data, algorithms for the analysis of Stark width dependence on temperature and electron density and for the investigation of the assumed correlation between Stark width and ionization potential of the upper level of analyzed transition, have been made. Developed algorithms enable fast data processing.

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On the Dependence of Stark Width and Shift on the Ionization Potential

Zeitschrift für Naturforschung A ◽

10.1515/zna-1984-0606 ◽

1984 ◽

Vol 39 (6) ◽

pp. 553-555 ◽

Cited By ~ 2

Author(s):

M. S. Dimitrijević ◽

N. Konjević

Keyword(s):

Ionization Potential ◽

Nuclear Charge ◽

Stark Broadening ◽

Charge Number ◽

Nuclear Charge Number ◽

Stark Width

The simple relations between the Stark broadening parameters and the ionization potential derived by Purić et al. [1] are discussed, and attention is drawn to the serious limitations for their application. The periodic dependence of the Stark width and shift on nuclear charge number obtained by the same authors [2] is also explained.

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An Attack on the Contamination Problem in the Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100061859 ◽

1967 ◽

Vol 25 ◽

pp. 368-368

Author(s):

J. J. Kelsch ◽

A. Holtz

Keyword(s):

Electron Microscope ◽

Pressure Gradient ◽

Ionization Potential ◽

Simple Solution ◽

Specimen Surface ◽

Contamination Rate ◽

Local Pressure ◽

High Ionization ◽

Hydrocarbon Molecules ◽

Contamination Problem

A simple solution to the serious problem of specimen contamination in the electron microscope is presented. This is accomplished by the introduction of clean helium into the vacuum exactly at the specimen position. The local pressure gradient thus established inhibits the migration of hydrocarbon molecules to the specimen surface. The high ionization potential of He permits the use of relatively large volumes of the gas, without interfering with gun stability. The contamination rate is reduced on metal samples by a factor of 10.

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