Fringing Fields

1987 ◽  
pp. 187-209 ◽  
Author(s):  
Hermann Wollnik
Keyword(s):  
Fringing Fields

Trial production of γ-type energy filtering TEM

1995 ◽  
Vol 53 ◽  
pp. 604-605
Author(s):  
Y. Taniguchi ◽  
E. Nakazawa ◽  
S. Taya
Keyword(s):  
Magnetic Energy ◽  
Electron Optics ◽  
Electron Microscopic ◽  
Mass Spectrometers ◽  
Ion Optics ◽  
Energy Filtering ◽  
New Information ◽  
New Type ◽  
Fringing Fields

Imaging energy filters can add new information to electron microscopic images with respect to energy-axis, so-called electron spectroscopic imaging (ESI). Recently, many good results have been reported using this imaging technique. ESI also allows high-contrast observation of unstained biological samples, becoming a trend of the field of morphology. We manufactured a new type of energy filter as a trial production. This energy filter consists of two magnets, and we call γ-filter since the trajectory of electrons shows ‘γ’-shape inside the filter. We evaluated the new energyγ-filter TEM with the γ-filter.Figure 1 shows schematic view of the electron optics of the γ-type energy filter. For the determination of the electron-optics of the γ-type energy filter, we used the TRIO (Third Order Ion Optics) program which has been developed for the design of high resolution mass spectrometers. The TRIO takes the extended fringing fields (EFF) into consideration. EFF makes it difficult to design magnetic energy filters with magnetic sector fields.

Calculation of the Ion Optical Properties of Inhomogeneous Magnetic Sector Fields Part 3: Oblique Incidence and Exit at Curved Boundaries

1959 ◽  
Vol 14 (9) ◽  
pp. 822-827 ◽  
Author(s):  
H. A. Tasman ◽  
A. J. H. Boerboom ◽  
H. Wachsmuth
Keyword(s):  
Oblique Incidence ◽  
Normal Incidence ◽  
Second Order ◽  
Resolving Power ◽  
High Mass ◽  
Curved Boundaries ◽  
Magnetic Sector ◽  
Mass Resolving Power ◽  
Mass Dispersion ◽  
Fringing Fields

In previous papers 1.2we presented the radial second order imaging properties of inhomogeneous magnetic sector fields with normal incidence and exit at plane boundaries. These fields may provide very high mass resolving power and mass dispersion without increase in radius or decrease of slit widths. In the present paper the calculations are extended to include the effect of oblique incidence and exit at curved boundaries. The influence of the fringing fields on axial focusing when the boundaries are oblique, is accounted for. It is shown that the second order angular aberration may Le eliminated by appropriate curvature of the boundaries.

scholarly journals Accurately predicting electron beam deflections in fringing fields of a solenoid

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Christof Baumgärtel ◽  
Ray T. Smith ◽  
Simon Maher
Keyword(s):  
Electron Beam ◽  
Beam Deflections ◽  
Fringing Fields

scholarly journals A simple model for calculating magnetic nanowire domain wall fringing fields

2012 ◽  
Vol 45 (9) ◽  
pp. 095002 ◽  
Author(s):  
Adam D West ◽  
Thomas J Hayward ◽  
Kevin J Weatherill ◽  
Thomas Schrefl ◽  
Dan A Allwood ◽  
...  
Keyword(s):  
Simple Model ◽  
Domain Wall ◽  
Magnetic Nanowire ◽  
Fringing Fields

Magnetic Deflecting Microscopy: A Novel Visualizing Method of Magnetic Stray Fields for Thick or Non-Transparent Magnetic TEM Samples

1998 ◽  
Vol 4 (S2) ◽  
pp. 404-405
Author(s):  
V.V. Volkov ◽  
Y. Zhu
Keyword(s):  
Imaging Techniques ◽  
Sample Thickness ◽  
Magnetic Domains ◽  
Lorentz Microscopy ◽  
New Class ◽  
Magnetic Imaging ◽  
Hard Magnets ◽  
Tem Method ◽  
Fringing Fields ◽  
Specimen Edge

For microstructure analysis of magnetic materials, in particular, for a new class of Nd-Fe-B hard magnets, a number of magnetic imaging techniques can be applied to gain different microstructure information. For instance, SEM magnetic imaging can be successfully used for very thick samples from a bulk ones down to a sample thickness of 10-20 μ. Below this limit the resolution of SEM magnetic images generally is too low to visualize fine details of magnetic structure. For very thin samples (less then 0.5 μm) magnetic Lorentz microscopy methods in conventional TEM are very useful tools to reveal magnetic domains and their structure. Therefore, it seems that relatively thick films of 0.5-20 μm in thickness are left out of the experimental limits of the methods discussed.We report on a novel, indirect TEM method that allows us to extend the limits of magnetic imaging for TEM non-transparent magnetic samples by viewing the surface stray fields and fringing fields generated by magnetic domains at specimen edge.

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