Calculation of the Ion Optical Properties of Inhomogeneous Magnetic Sector Fields Part 3: Oblique Incidence and Exit at Curved Boundaries

1959 ◽  
Vol 14 (9) ◽  
pp. 822-827 ◽  
Author(s):  
H. A. Tasman ◽  
A. J. H. Boerboom ◽  
H. Wachsmuth
Keyword(s):  
Oblique Incidence ◽  
Normal Incidence ◽  
Second Order ◽  
Resolving Power ◽  
High Mass ◽  
Curved Boundaries ◽  
Magnetic Sector ◽  
Mass Resolving Power ◽  
Mass Dispersion ◽  
Fringing Fields

In previous papers 1.2we presented the radial second order imaging properties of inhomogeneous magnetic sector fields with normal incidence and exit at plane boundaries. These fields may provide very high mass resolving power and mass dispersion without increase in radius or decrease of slit widths. In the present paper the calculations are extended to include the effect of oblique incidence and exit at curved boundaries. The influence of the fringing fields on axial focusing when the boundaries are oblique, is accounted for. It is shown that the second order angular aberration may Le eliminated by appropriate curvature of the boundaries.

Calculation of the Ion Optical Properties of Inhomogeneous Magnetic Sector Fields, Part 2: The Second Order Aberrations Outside the Median Plane

1959 ◽  
Vol 14 (9) ◽  
pp. 818-822 ◽  
Author(s):  
H. Wachsmuth ◽  
A. J. H. Boerboom ◽  
H. A. Tasman
Keyword(s):  
Optical Properties ◽  
Radial Direction ◽  
Median Plane ◽  
Second Order ◽  
Resolving Power ◽  
Mass Spectrometers ◽  
Magnetic Sector ◽  
Mass Dispersion ◽  
Field Boundaries ◽  
Fringing Fields

In a previous article 1 we pointed out the possible advantages of inhomogeneous magnetic sector fields for mass spectrometers, as these fields permit a substantial increase in mass dispersion and resolving power without change in radius or slit widths. In the said paper 1 we calculated the coefficients of the second order aberrations in the median plane, as well as the field shape required to eliminate the second order angular aberration in the median plane. In the present paper we calculate the second order aberrations outside the median plane referring to focusing in the radial direction. Again the influence of fringing fields is being neglected, and the field boundaries are supposed to be plane and normal to the main path at the point where it enters and leaves the field.

Numerical analysis of trajectories in a Cassinian ion trap of second order with trap door ion inlet

2021 ◽  
Vol 27 (1) ◽  
pp. 3-12
Author(s):  
Bjoern Raupers ◽  
Hana Medhat ◽  
Juergen Grotemeyer ◽  
Frank Gunzer
Keyword(s):  
Ion Trap ◽  
Ion Traps ◽  
Second Order ◽  
Resolving Power ◽  
Periodic Pattern ◽  
Ion Motion ◽  
Trap Door ◽  
Mass Resolving Power ◽  
Long Time ◽  
The Fourier Transform

Ion traps like the Orbitrap are well known mass analyzers with very high resolving power. This resolving power is achieved with help of ions orbiting around an inner electrode for long time, in general up to a few seconds, since the mass signal is obtained by calculating the Fourier Transform of the induced signal caused by the ion motion. A similar principle is applied in the Cassinian Ion Trap of second order, where the ions move in a periodic pattern in-between two inner electrodes. The Cassinian ion trap has the potential to offer mass resolving power comparable to the Orbitrap with advantages regarding the experimental implementation. In this paper we have investigated the details of the ion motion analyzing experimental data and the results of different numerical methods, with focus on increasing the resolving power by increasing the oscillation frequency for ions in a high field ion trap. In this context the influence of the trap door, a tunnel through which the ions are injected into the trap, on the ion velocity becomes especially important.

scholarly journals High mass accuracy and high mass resolving power FT-ICR secondary ion mass spectrometry for biological tissue imaging

2013 ◽  
Vol 405 (18) ◽  
pp. 6069-6076 ◽  
Author(s):  
Donald F. Smith ◽  
Andras Kiss ◽  
Franklin E. Leach ◽  
Errol W. Robinson ◽  
Ljiljana Paša-Tolić ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Secondary Ion Mass Spectrometry ◽  
Mass Accuracy ◽  
Resolving Power ◽  
Tissue Imaging ◽  
High Mass ◽  
High Mass Accuracy ◽  
Mass Resolving Power ◽  
Secondary Ion ◽  
Ft Icr

scholarly journals Simple and rapid characterization of mycolic acids from Dietzia strains by using MALDI spiral-TOFMS with ultra high mass-resolving power

2013 ◽  
Vol 66 (12) ◽  
pp. 713-717 ◽  
Author(s):  
Kanae Teramoto ◽  
Tomohiko Tamura ◽  
Satoshi Hanada ◽  
Takafumi Sato ◽  
Hiroko Kawasaki ◽  
...  
Keyword(s):  
Resolving Power ◽  
High Mass ◽  
Mycolic Acids ◽  
Mass Resolving Power ◽  
Rapid Characterization

Time-of-flight mass spectrographs of high mass resolving power

2019 ◽  
Vol 34 (36) ◽  
pp. 1942001
Author(s):  
H. Wollnik ◽  
M. Wada ◽  
P. Schury ◽  
M. Rosenbusch ◽  
Y. Ito ◽  
...  
Keyword(s):  
Time Of Flight ◽  
Molecular Ions ◽  
Resolving Power ◽  
High Mass ◽  
Energetic Ions ◽  
Structure Of Molecules ◽  
Mass Resolving Power ◽  
Sum Formula ◽  
The Masses

The masses of charged atoms and molecules were first investigated by laterally dispersive sector field mass analyzers, which early on already achieved high mass resolving powers. Equally, high mass resolving powers were achieved by time-of-flight mass analyzers during the last decades. These measurements became possible when fast and precise electronic circuitries became available. Such techniques have been developed and used extensively for the mass analysis of short-lived nuclei, whose mass values reveal insight in processes that describe the formation of elements in star explosions. Precise mass determinations of short-lived ions have been performed for energetic ions in large accelerator storage rings as well as for low-energy ions in time-of-flight mass spectrographs with long flight paths. Similarly, precise mass measurements can also be performed for molecular ions that help to reveal the structure of molecules. In case of very high mass resolving powers, the mass determination of molecular ions can be so high that the measured ion mass directly reveals the molecule’s sum formula.

Simultaneous Hydrogen and Heavier Element Isotopic Ratio Images with a Scanning Submicron Ion Probe and Mass Resolved Polyatomic Ions

2014 ◽  
Vol 20 (2) ◽  
pp. 577-581 ◽  
Author(s):  
Georges Slodzian ◽  
Ting-Di Wu ◽  
Noémie Bardin ◽  
Jean Duprat ◽  
Cécile Engrand ◽  
...  
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Isotopic Ratio ◽  
Simultaneous Recording ◽  
Mass Resolution ◽  
Resolving Power ◽  
High Mass ◽  
Ratio Measurement ◽  
Ion Probe ◽  
Secondary Ions ◽  
Mass Resolving Power

AbstractIn situ microanalysis of solid samples is often performed using secondary ion mass spectrometry (SIMS) with a submicron ion probe. The destructive nature of the method makes it mandatory to prevent information loss by using instruments combining efficient collection of secondary ions and a mass spectrometer with parallel detection capabilities. The NanoSIMS meets those requirements with a magnetic spectrometer but its mass selectivity has to be improved for accessing opportunities expected from polyatomic secondary ions. We show here that it is possible to perform D/H ratio measurement images using 12CD−/12CH−, 16OD−/16OH−, or 12C2D−/12C2H− ratios. These polyatomic species allow simultaneous recording of D/H ratios and isotopic compositions of heavier elements like 15N/14N (via 12C15N−/12C14N−) and they provide a powerful tool to select the phase of interest (e.g., mineral versus organics). We present high mass resolution spectra and an example of isotopic imaging where D/H ratios were obtained via the 12C2D−/12C2H− ratio with 12C2D− free from neighboring mass interferences. Using an advanced mass resolution protocol, a “conventional” mass resolving power of 25,000 can be achieved. Those results open many perspectives for isotopic imaging at a fine scale in biology, material science, geochemistry, and cosmochemistry.

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