Magnetron sputtering for development of nanostructured materials

2022 ◽  
pp. 177-199
Author(s):  
Ajit Behera ◽  
Shampa Aich ◽  
T. Theivasanthi
2020 ◽  
Vol 8 (39) ◽  
pp. 20260-20285
Author(s):  
Fengyi Wang ◽  
Haitao Zhao ◽  
Jie Liang ◽  
Tingshuai Li ◽  
Yongsong Luo ◽  
...  

This review summarizes the research progress of magnetron sputtered nanostructured electrode materials for EES, providing illustrations of how to rationally design and optimize electrode materials via magnetron sputtering technology.


Author(s):  
M. José-Yacamán

Electron microscopy is a fundamental tool in materials characterization. In the case of nanostructured materials we are looking for features with a size in the nanometer range. Therefore often the conventional TEM techniques are not enough for characterization of nanophases. High Resolution Electron Microscopy (HREM), is a key technique in order to characterize those materials with a resolution of ~ 1.7A. High resolution studies of metallic nanostructured materials has been also reported in the literature. It is concluded that boundaries in nanophase materials are similar in structure to the regular grain boundaries. That work therefore did not confirm the early hipothesis on the field that grain boundaries in nanostructured materials have a special behavior. We will show in this paper that by a combination of HREM image processing, and image calculations, it is possible to prove that small particles and coalesced grains have a significant surface roughness, as well as large internal strain.


Polymer News ◽  
2005 ◽  
Vol 30 (7) ◽  
pp. 214-216
Author(s):  
G. Carotenuto

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2004 ◽  
Vol 29 (3) ◽  
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Author(s):  
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Vol 29 (1) ◽  
pp. 17-18
Author(s):  
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2006 ◽  
Vol 2006 (suppl_23_2006) ◽  
pp. 269-274 ◽  
Author(s):  
R. Mirchev ◽  
V. Antonov ◽  
I. Iordanova ◽  
P. J. Kelly

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