Low-Frequency noise spectroscopy for characterization of polycrystalline semiconductor thin films and polysilicon thin film transistors

2002 ◽  
pp. 291-325
Author(s):  
Charalabos A. Dimitriadis ◽  
George Kamarinos
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy ◽  
Semiconductor Thin Films ◽  
Polycrystalline Semiconductor

Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors

1999 ◽  
Vol 46 (5) ◽  
pp. 968-974 ◽  
Author(s):  
C.T. Angelis ◽  
C.A. Dimitriadis ◽  
J. Brini ◽  
G. Kamarinos ◽  
V.K. Gueorguiev ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Polycrystalline Silicon ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film ◽  
Noise Spectroscopy

Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements

2013 ◽  
Vol 34 (11) ◽  
pp. 1403-1405 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Forough Mahmoudabadi ◽  
Nackbong Choi ◽  
Miltiadis K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
High Current ◽  
Low Frequency Noise ◽  
Current Stress ◽  
Noise Measurements ◽  
Amorphous Ingazno

Investigation of the Device Degradation Mechanism in Pentacene-Based Thin-Film Transistors Using Low-Frequency-Noise Spectroscopy

2010 ◽  
Vol 57 (2) ◽  
pp. 385-390 ◽  
Author(s):  
Lin Ke ◽  
Surani Bin Dolmanan ◽  
Chellappan Vijila ◽  
Soo Jin Chua ◽  
Ye Hua Han ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Degradation Mechanism ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Spectroscopy

Static and low frequency noise characterization of N-type random network of carbon nanotubes thin film transistors

2013 ◽  
Vol 114 (15) ◽  
pp. 154503 ◽  
Author(s):  
Min-Kyu Joo ◽  
Mireille Mouis ◽  
Dae-Young Jeon ◽  
Gyu-Tae Kim ◽  
Un Jeong Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Carbon Nanotubes ◽  
Thin Film Transistors ◽  
Random Network ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization

Low-Frequency Noise Characterization of Amorphous InGaZnO Thin-Film Transistors with Double-Stack Ga2O3/SiO2 Dielectric

2014 ◽  
Vol 3 (10) ◽  
pp. Q55-Q58 ◽  
Author(s):  
T. H. Chang ◽  
C. J. Chiu ◽  
S. J. Chang ◽  
T. H. Yang ◽  
S. L. Wu ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization ◽  
Amorphous Ingazno

Low frequency noise in amorphous silicon thin film transistors with SiNx gate dielectric

2009 ◽  
Vol 105 (12) ◽  
pp. 124504 ◽  
Author(s):  
S. L. Rumyantsev ◽  
Sung Hun Jin ◽  
M. S. Shur ◽  
Mun-Soo Park
Keyword(s):  
Thin Film ◽  
Amorphous Silicon ◽  
Thin Film Transistors ◽  
Gate Dielectric ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film

scholarly journals Numerical simulations of conduction and low-frequency noise in polysilicon thin film transistors

2007 ◽  
Vol 515 (19) ◽  
pp. 7556-7559 ◽  
Author(s):  
A. Boukhenoufa ◽  
C. Cordier ◽  
L. Pichon ◽  
B. Cretu
Keyword(s):  
Thin Film ◽  
Numerical Simulations ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise
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