Characterization of High-Current Stress-Induced Instability in Amorphous InGaZnO Thin-Film Transistors by Low-Frequency Noise Measurements

2013 ◽  
Vol 34 (11) ◽  
pp. 1403-1405 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Forough Mahmoudabadi ◽  
Nackbong Choi ◽  
Miltiadis K. Hatalis ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
High Current ◽  
Low Frequency Noise ◽  
Current Stress ◽  
Noise Measurements ◽  
Amorphous Ingazno

Low-Frequency Noise Characterization of Amorphous InGaZnO Thin-Film Transistors with Double-Stack Ga2O3/SiO2 Dielectric

2014 ◽  
Vol 3 (10) ◽  
pp. Q55-Q58 ◽  
Author(s):  
T. H. Chang ◽  
C. J. Chiu ◽  
S. J. Chang ◽  
T. H. Yang ◽  
S. L. Wu ◽  
...  
Keyword(s):  
Thin Film ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization ◽  
Amorphous Ingazno

Comparative Study of Active-Over-Metal and Metal-Over-Active Amorphous IGZO Thin-Film Transistors With Low-Frequency Noise Measurements

2012 ◽  
Vol 33 (4) ◽  
pp. 555-557 ◽  
Author(s):  
Andreas Tsormpatzoglou ◽  
Nikolaos A. Hastas ◽  
Shahrukh Khan ◽  
Miltiadis Hatalis ◽  
Charalabos A. Dimitriadis
Keyword(s):  
Thin Film ◽  
Comparative Study ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Measurements

Study of the Drain Leakage Current in Bottom-Gated Nanocrystalline Silicon Thin-Film Transistors by Conduction and Low-Frequency Noise Measurements

2007 ◽  
Vol 54 (5) ◽  
pp. 1076-1082 ◽  
Author(s):  
Argyrios T. Hatzopoulos ◽  
Nikolaos Arpatzanis ◽  
Dimitrios H. Tassis ◽  
Charalabos A. Dimitriadis ◽  
Maher Oudwan ◽  
...  
Keyword(s):  
Thin Film ◽  
Leakage Current ◽  
Thin Film Transistors ◽  
Low Frequency ◽  
Nanocrystalline Silicon ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Silicon Thin Film ◽  
Noise Measurements

Static and low frequency noise characterization of N-type random network of carbon nanotubes thin film transistors

2013 ◽  
Vol 114 (15) ◽  
pp. 154503 ◽  
Author(s):  
Min-Kyu Joo ◽  
Mireille Mouis ◽  
Dae-Young Jeon ◽  
Gyu-Tae Kim ◽  
Un Jeong Kim ◽  
...  
Keyword(s):  
Thin Film ◽  
Carbon Nanotubes ◽  
Thin Film Transistors ◽  
Random Network ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Characterization
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