Modeling and characterization of the low frequency noise behavior for amorphous InGaZnO thin film transistors in the subthreshold region
Keyword(s):
2013 ◽
Vol 34
(11)
◽
pp. 1403-1405
◽
Keyword(s):
Keyword(s):
Keyword(s):
2017 ◽
Vol 35
(1)
◽
pp. 010601
◽
Keyword(s):
Keyword(s):
Keyword(s):
2012 ◽
Vol 51
(10R)
◽
pp. 100206
◽
Keyword(s):
2015 ◽
Vol 36
(12)
◽
pp. 1332-1335
◽
Keyword(s):
Keyword(s):