In situ observations of solidification processes in γ-TiAl alloys by synchrotron radiation

2010 ◽  
Vol 58 (7) ◽  
pp. 2408-2418 ◽  
Author(s):  
Olga Shuleshova ◽  
Dirk Holland-Moritz ◽  
Wolfgang Löser ◽  
Andrea Voss ◽  
Helena Hartmann ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Tial Alloys ◽  
Solidification Processes ◽  
In Situ Observations

The Use of In Situ Characterization Techniques for the Development of Intermetallic Titanium Aluminides

2014 ◽  
Vol 783-786 ◽  
pp. 2097-2102 ◽  
Author(s):  
Svea Mayer ◽  
Emanuel Schwaighofer ◽  
Martin Schloffer ◽  
Helmut Clemens
Keyword(s):  
Titanium Aluminides ◽  
Turbine Blades ◽  
Heat Treatments ◽  
Mechanical Processing ◽  
Tial Alloys ◽  
Solidification Processes ◽  
Consistent Picture ◽  
Aero Engines ◽  
Multi Phase

Urgent needs concerning energy efficiency and environmental politics require novel approaches to materials design. One recent example is thereby the implementation of light-weight intermetallic titanium aluminides as structural materials for the application in turbine blades of aero-engines as well as in turbocharger turbine wheels for the next generation of automotive engines. Each production process leads to specific microstructures which can be altered and optimized by thermo-mechanical processing and / or subsequent heat-treatments. To develop sound and sustainable processing routes, knowledge on solidification processes and phase transformation sequences in advanced TiAl alloys is fundamental. Therefore, in-situ diffraction techniques employing synchrotron radiation and neutrons were used for establishing phase fraction diagrams, investigating advanced heat-treatments as well as for optimizing thermo-mechanical processing. Summarizing all results a consistent picture regarding microstructure formation and its impact on mechanical properties in advanced multi-phase TiAl alloys can be given.

In situ observations of solidification in Ti–Al–Ta alloys by synchrotron radiation

2011 ◽  
Vol 19 (5) ◽  
pp. 688-692 ◽  
Author(s):  
Olga Shuleshova ◽  
Dirk Holland-Moritz ◽  
Andrea Voss ◽  
Wolfgang Löser
Keyword(s):  
Synchrotron Radiation ◽  
In Situ Observations

In situ observations of martensitic transformations in Ti50Ni34Cu16 alloy by synchrotron radiation

2006 ◽  
Vol 438-440 ◽  
pp. 480-484 ◽  
Author(s):  
T. Ohba ◽  
T. Taniwaki ◽  
H. Miyamoto ◽  
K. Otsuka ◽  
K. Kato
Keyword(s):  
Synchrotron Radiation ◽  
Martensitic Transformations ◽  
In Situ Observations

Solidification and melting of high temperature materials: in situ observations by synchrotron radiation

2011 ◽  
Vol 47 (11) ◽  
pp. 4497-4513 ◽  
Author(s):  
O. Shuleshova ◽  
W. Löser ◽  
D. Holland-Moritz ◽  
D. M. Herlach ◽  
J. Eckert
Keyword(s):  
High Temperature ◽  
Synchrotron Radiation ◽  
High Temperature Materials ◽  
In Situ Observations

Metastable formation of decagonal quasicrystals during solidification of undercooled Al-Ni melts: In situ observations by synchrotron radiation

2009 ◽  
Vol 86 (3) ◽  
pp. 36002 ◽  
Author(s):  
O. Shuleshova ◽  
D. Holland-Moritz ◽  
W. Löser ◽  
G. Reinhart ◽  
G. N. Iles ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Decagonal Quasicrystals ◽  
In Situ Observations

ChemInform Abstract: Solidification and Melting of High Temperature Materials: in situ Observations by Synchrotron Radiation

ChemInform ◽  
2012 ◽  
Vol 43 (19) ◽  
pp. no-no
Author(s):  
O. Shuleshova ◽  
W. Loeser ◽  
D. Holland-Moritz ◽  
D. M. Herlach ◽  
J. Eckert
Keyword(s):  
High Temperature ◽  
Synchrotron Radiation ◽  
High Temperature Materials ◽  
In Situ Observations

In situ observations of electromigration induced void behavior

1995 ◽  
Vol 53 ◽  
pp. 244-245
Author(s):  
T. Marieb ◽  
J. C. Bravman ◽  
P. Flinn ◽  
D. Gardner ◽  
M. Madden
Keyword(s):  
Electron Microscopy ◽  
Void Nucleation ◽  
Plan View ◽  
Transmission Electron ◽  
Nucleation Sites ◽  
Microelectronics Industry ◽  
In Situ Observations ◽  
Backscatter Electron Detector ◽  
Voltage Scanning

Electromigration and stress voiding have been active areas of research in the microelectronics industry for many years. While accelerated testing of these phenomena has been performed for the last 25 years[1-2], only recently has the introduction of high voltage scanning electron microscopy (HVSEM) made possible in situ testing of realistic, passivated, full thickness samples at high resolution.With a combination of in situ HVSEM and post-testing transmission electron microscopy (TEM) , electromigration void nucleation sites in both normal polycrystalline and near-bamboo pure Al were investigated. The effect of the microstructure of the lines on the void motion was also studied.The HVSEM used was a slightly modified JEOL 1200 EX II scanning TEM with a backscatter electron detector placed above the sample[3]. To observe electromigration in situ the sample was heated and the line had current supplied to it to accelerate the voiding process. After testing lines were prepared for TEM by employing the plan-view wedge technique [6].

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