Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters

2021 ◽  
Vol 48 ◽  
pp. 101283
Author(s):  
Zixin Shen ◽  
Amos Hong ◽  
Argon Chen
Keyword(s):  
Relative Importance ◽  
Importance Analysis ◽  
Relative Importance Analysis

The bonding variation of γ-TiAl during deformation

2021 ◽  
Vol 23 (6) ◽  
pp. 3905-3914
Author(s):  
Jinkai Wang ◽  
Xin Cui ◽  
Jianxin Huang ◽  
Hao Wang ◽  
Zhanpeng Lu ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Local Energy ◽  
Relative Importance ◽  
Importance Analysis ◽  
Relative Importance Analysis

A relative importance analysis of various types of bonding through local energy and electronic structure was performed.

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