Cross diffusion-induced pattern in an SI model

2010 ◽  
Vol 217 (5) ◽  
pp. 1965-1970 ◽  
Author(s):  
Yi Wang ◽  
Jianzhong Wang ◽  
Li Zhang
Keyword(s):  
2013 ◽  
Vol 765-767 ◽  
pp. 2276-2279
Author(s):  
Yu Juan Jiao

In this paper, we consider an SI model with cross-diffusion, and show that the measuring technology and its application, namely, the cross-diffusion is able to induce the Turing instability under some conditions.


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