Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA

2004 ◽  
Vol 231-232 ◽  
pp. 230-234 ◽  
Author(s):  
J.A.Tony Ohlhausen ◽  
M.R. Keenan ◽  
P.G. Kotula ◽  
D.E. Peebles
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