Application of multivariate statistical analysis methods for improved time-of-flight secondary ion mass spectrometry depth profiling of buried interfaces and particulate

Time Of Flight ◽

Depth Profiling ◽

Buried Interfaces ◽

Secondary Ion ◽

Statistical Analysis Methods

Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images—looking beyond the obvious

10.1016/j.apsusc.2004.03.027 ◽

2004 ◽

Vol 231-232 ◽

pp. 245-249 ◽

Cited By ~ 23

Author(s):

Vincent S. Smentkowski ◽

J.A. (Tony) Ohlhausen ◽

P.G. Kotula ◽

M.R. Keenan

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Chemometric and Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry Spectra from Complex Cu–Fe Sulfides

Analytical Chemistry ◽

10.1021/ac202971y ◽

2012 ◽

Vol 84 (6) ◽

pp. 2754-2760 ◽

Cited By ~ 10

Author(s):

Yogesh Kalegowda ◽

Sarah L Harmer

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate

10.1016/j.apsusc.2006.03.091 ◽

2006 ◽

Vol 253 (2) ◽

pp. 1015-1022 ◽

Cited By ~ 5

Author(s):

V.S. Smentkowski ◽

H.M. Duong ◽

R. Tamaki ◽

M.R. Keenan ◽

J.A. Tony Ohlhausen ◽

...

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Polyhedral Oligomeric Silsesquioxane ◽

Ion Mass Spectrometry ◽

Oligomeric Silsesquioxane ◽

Multivariate Statistical Analysis of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Spectral Images - Unbiased Analysis of the Entire 3-Dimensional Data Cube

Microscopy and Microanalysis ◽

10.1017/s1431927605500734 ◽

2005 ◽

Vol 11 (S02) ◽

Author(s):

V S Smentkowski

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Data Cube ◽

3 Dimensional ◽

Tof Sims ◽

Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images using AXSIA

10.1016/j.apsusc.2004.03.020 ◽

2004 ◽

Vol 231-232 ◽

pp. 230-234 ◽

Cited By ~ 42

Author(s):

J.A.Tony Ohlhausen ◽

M.R. Keenan ◽

P.G. Kotula ◽

D.E. Peebles

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Multivariate Statistical Analysis of Time of Flight Secondary Ion Mass Spectrometry Raw Data Files

Microscopy and Microanalysis ◽

10.1017/s1431927607072224 ◽

2007 ◽

Vol 13 (S02) ◽

Author(s):

V Smentkowski ◽

S Ostrowski ◽

M Keenan ◽

J Ohlhausen ◽

P Kotula

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Raw Data ◽

Ion Mass Spectrometry ◽

Data Files ◽

Multivariate Statistical Analysis of Concatenated Time-of-Flight Secondary Ion Mass Spectrometry Spectral Images. Complete Description of the Sample with One Analysis

Analytical Chemistry ◽

10.1021/ac048468y ◽

2005 ◽

Vol 77 (5) ◽

pp. 1530-1536 ◽

Cited By ~ 24

Author(s):

V. S. Smentkowski ◽

M. R. Keenan ◽

J. A. (Tony) Ohlhausen ◽

P. G. Kotula

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Multivariate statistical analysis of time-of-flight secondary ion mass spectrometry images?looking beyond the obvious

10.1016/s0169-4332(04)00263-6 ◽

2004 ◽

Cited By ~ 1

Author(s):

V SMENTKOWSKI

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Time Of Flight ◽

Ion Mass Spectrometry ◽

Investigating Pb diffusion across buried interfaces in Pb(Zr0.2 Ti0.8 )O3 thin films via time-of-flight secondary ion mass spectrometry depth profiling

Surface and Interface Analysis ◽

10.1002/sia.6255 ◽

2017 ◽

Vol 49 (10) ◽

pp. 973-977 ◽

Cited By ~ 3

Author(s):

John S. Mangum ◽

Stephen Podowitz-Thomas ◽

Jason Nikkel ◽

Chuanzhen Zhou ◽

Jacob L. Jones

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Time Of Flight ◽

Depth Profiling ◽

Buried Interfaces ◽

Ion Mass Spectrometry ◽

Secondary ion mass spectrometry for the identification of polymers with noncharacteristic secondary ions using multivariate statistical analysis

Applied Physics Letters ◽

10.1063/1.1642278 ◽

2004 ◽

Vol 84 (10) ◽

pp. 1789-1791 ◽

Cited By ~ 2

Author(s):

W. J. H. van Gennip ◽

P. C. Thüne ◽

J. B. Dijkstra ◽

J. W. Niemantsverdriet

Keyword(s):

Mass Spectrometry ◽

Statistical Analysis ◽

Secondary Ions ◽

Ion Mass Spectrometry ◽