Total internal reflection fluorescence microscopy—a powerful tool to study single quantum dots

2004 ◽  
Vol 234 (1-4) ◽  
pp. 86-92 ◽  
Author(s):  
A.Yu Kobitski ◽  
C.D Heyes ◽  
G.U Nienhaus
2014 ◽  
Vol 111 (48) ◽  
pp. 17164-17169 ◽  
Author(s):  
Jérôme Boulanger ◽  
Charles Gueudry ◽  
Daniel Münch ◽  
Bertrand Cinquin ◽  
Perrine Paul-Gilloteaux ◽  
...  

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