The critical layer number of epitaxially grown Cu and Ni films with strained structure

2005 ◽  
Vol 239 (3-4) ◽  
pp. 259-261 ◽  
Author(s):  
J.C. Li ◽  
W. Liu ◽  
Q. Jiang
Keyword(s):  
Author(s):  
Gilles Tissot ◽  
Mengqi Zhang ◽  
Francisco C. Lajús ◽  
André V. Cavalieri ◽  
Peter Jordan ◽  
...  

2020 ◽  
Vol 124 (49) ◽  
pp. 27176-27184
Author(s):  
Yasushi Ishiguro ◽  
Kirill Bogdanov ◽  
Naoko Kodama ◽  
Mizuki Ogiba ◽  
Tatsuya Ohno ◽  
...  

2021 ◽  
Vol 3 (1) ◽  
pp. 468-475
Author(s):  
Haruka Takekuma ◽  
Junfu Leng ◽  
Kazutaka Tateishi ◽  
Yang Xu ◽  
Yinthai Chan ◽  
...  

2020 ◽  
Vol 101 ◽  
pp. 107576 ◽  
Author(s):  
E.V. Rut'kov ◽  
E.Y. Afanas'eva ◽  
N.R. Gall
Keyword(s):  

2017 ◽  
Vol 9 (14) ◽  
pp. 12253-12263 ◽  
Author(s):  
Jiajun Qiu ◽  
Hao Geng ◽  
Donghui Wang ◽  
Shi Qian ◽  
Hongqin Zhu ◽  
...  
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document