scholarly journals Stray Light Analysis by Ray Tracing Simulation for the Wide-Angle Multiband Camera OROCHI onboard the Martian Moons Exploration (MMX) Spacecraft

Author(s):  
Ryota Fuse ◽  
Keigo Enya ◽  
Shingo Kameda ◽  
Hiroki Kato ◽  
Naoya Osada ◽  
...  
Proceedings ◽  
2018 ◽  
Vol 2 (13) ◽  
pp. 1056
Author(s):  
Marcus Baumgart ◽  
Norbert Druml ◽  
Markus Dielacher ◽  
Cristina Consani

Robust, fast and reliable examination of the surroundings is essential for further advancements in autonomous driving and robotics. Time-of-Flight (ToF) camera sensors are a key technology to measure surrounding objects and their distances on a pixel basis in real-time. Environmental effects, like rain in front of the sensor, can influence the distance accuracy of the sensor. Here we use an optical ray-tracing based procedure to examine the rain effect on the ToF image. Simulation results are presented for experimental rain droplet distributions, characteristic of intense rainfall at rates of 25 mm/h and 100 mm/h. The ray-tracing based simulation data and results serve as an input for developing and testing rain signal suppression strategies.


2013 ◽  
Vol 2013 ◽  
pp. 1-7 ◽  
Author(s):  
Hyun Wook Moon ◽  
Woojoong Kim ◽  
Sewoong Kwon ◽  
Jaeheung Kim ◽  
Young Joong Yoon

A simple and exact closed-form equation to determine a penetrated ray path in a ray tracing is proposed for an accurate channel prediction in indoor environments. Whereas the penetrated ray path in a conventional ray tracing is treated as a straight line without refraction, the proposed method is able to consider refraction through the wall in the penetrated ray path. Hence, it improves the accuracy in ray tracing simulation. To verify the validation of the proposed method, the simulated results of conventional method, approximate method, and proposed method are compared with the measured results. The comparison shows that the proposed method is in better agreement with the measured results than the conventional method and approximate method, especially in high frequency bands.


2008 ◽  
Vol 56 (3) ◽  
pp. 848-857 ◽  
Author(s):  
Franco Fuschini ◽  
Hassan El-Sallabi ◽  
Vittorio Degli-Esposti ◽  
Lasse Vuokko ◽  
Doriana Guiducci ◽  
...  

2020 ◽  
Vol 28 (23) ◽  
pp. 35376 ◽  
Author(s):  
Qiwei Wang ◽  
Dewen Cheng ◽  
Qichao Hou ◽  
Luo Gu ◽  
Yongtian Wang
Keyword(s):  

2021 ◽  
Vol 54 (2) ◽  
Author(s):  
Hongyu Peng ◽  
Tuerxun Ailihumaer ◽  
Fumihiro Fujie ◽  
Zeyu Chen ◽  
Balaji Raghothamachar ◽  
...  

Residual contrast of threading edge dislocations is observed in synchrotron back-reflection X-ray topographs of 4H-SiC epitaxial wafers recorded using basal plane reflections where both g · b = 0 and g · b × l = 0. The ray-tracing simulation method based on the orientation contrast formation mechanism is applied to simulate images of such dislocations by applying surface relaxation effects. The simulated contrast features match the observed features on X-ray topographs, clearly demonstrating that the contrast is dominated by surface relaxation. Depth profiling indicates that the surface relaxation primarily takes place within a depth of 5 µm below the surface.


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