scholarly journals Three-Dimensional Microstructural Visualization of Mitosis using Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) and 3Mv Ultra-High Voltage Electron Microscope (UHVEM) Tomography with Nanoscale Resolution at Whole Cell Level

2015 ◽  
Vol 108 (2) ◽  
pp. 618a ◽  
Author(s):  
Atsuko H. Iwane ◽  
Keisuke Ohta
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