The need to detect low intensity beams of resolved ions with keV energy is encountered frequently in mass spectrometry. It is most readily accomplished by using some form of pulse-counting detector in which ions are allowed to strike a target surface (conversion dynode) where each ion releases a pulse of low energy secondary electrons. The secondary electrons undergo further amplification in an electron multiplier or scintillator type of ion detector which is specially designed to detect single ions. Ion-to-electron conversion, amplification of the secondary electrons, efficiency of ion detection by pulse counting and dead-time corrections to observed random counting rates are all statistical processes which must be understood so that observed data can be corrected properly to obtain precise and accurate measurements. These processes are reviewed, along with some of the basic properties of ion-induced secondary electron emission from an amorphous Al2O3 thin film target. Ion detection in the ion microprobe is interpreted in light of these basic considerations, and several mass spectra are given for electron multiplier dynode surfaces.
Surface conversion
