Annealing temperature dependent on structural, optical and electrical properties of indium oxide thin films deposited by electron beam evaporation method
2010 ◽
Vol 10
(3)
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pp. 880-885
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2005 ◽
Vol 31
(2)
◽
pp. 87-93
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2015 ◽
Vol 15
(9)
◽
pp. 964-969
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2019 ◽
Vol 90
◽
pp. 32-40
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Keyword(s):
2009 ◽
Vol 79-82
◽
pp. 787-790