Influence of copper concentration on sprayed CZTS thin films deposited at high temperature

2015 ◽  
Vol 41 (7) ◽  
pp. 8299-8304 ◽  
Author(s):  
S.M. Bhosale ◽  
M.P. Suryawanshi ◽  
J.H. Kim ◽  
A.V. Moholkar
2018 ◽  
Vol 216 ◽  
pp. 154-157 ◽  
Author(s):  
S. Mahjoubi ◽  
N. Bitri ◽  
M. Abaab ◽  
I. Ly

2019 ◽  
Vol 125 (3) ◽  
Author(s):  
Ahmed Ziti ◽  
Bouchaib Hartiti ◽  
Hicham Labrim ◽  
Salah Fadili ◽  
Hervé Joël Tchognia Nkuissi ◽  
...  

2003 ◽  
Vol 777 ◽  
Author(s):  
J.S. Romero ◽  
A.G. Fitzgerald

AbstractCopper migration is observed in the SEM in amorphous GeSe2/Cu thin films when an electron beam is focused in pulsed or continuous operation on the surface of these thin films. The phenomenon can be explained using a simple model in which the population of D- centers is considered to increase upon electron irradiation. The increase in the D- center population is envisaged as due to the breaking of bonds by the electron radiation and by the constant presence of negative charge in irradiated regions. Changes in copper concentration of 20%-30% have been obtained. Additionally we have observed the local crystallization of amorphous GeSe2/Cu thin films in the TEM when the samples were subjected to intense electron bombardment. The crystalline product has been identified as Berzelianite (Cu2Se).


2007 ◽  
Vol 43 (4) ◽  
pp. 239-242
Author(s):  
S. Kh. Suleimanov ◽  
O. A. Dudko ◽  
V. G. Dyskin ◽  
Z. S. Settarova ◽  
M. U. Dzhanklych

Author(s):  
Wenbin Hao ◽  
Jinze Li ◽  
Wei Li ◽  
Jiansheng Zhao ◽  
Jianfeng Chen

2021 ◽  
Vol 415 ◽  
pp. 127097
Author(s):  
P.C. Silva Neto ◽  
D.A. Ramirez ◽  
A.R. Terto ◽  
J.Y.E. Santos ◽  
J.C.V. Dos Santos ◽  
...  

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