Characterization of molecular organization in pentacene thin films on SiO2 surface using infrared spectroscopy, spectroscopic ellipsometry, and atomic force microscopy
2020 ◽
Vol 92
(10)
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pp. 6806-6810
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2015 ◽
Vol 89
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pp. 50-56
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Keyword(s):
2006 ◽
Vol 243
(1)
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pp. 16-19
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2012 ◽
Vol 405
(5)
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pp. 1463-1478
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Keyword(s):
2004 ◽
Vol 20-21
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pp. 611-616
Keyword(s):
2015 ◽
Vol 70
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pp. 373-378
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