Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

Journal of Metastable and Nanocrystalline Materials ◽

10.4028/www.scientific.net/jmnm.20-21.611 ◽

2004 ◽

Vol 20-21 ◽

pp. 611-616

Author(s):

José M. Barandiarán ◽

Iñaki Orue ◽

M.L. Fdez-Gubieda ◽

A. García Prieto

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

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Surface characterization of microstructures on glass by atomic force microscopy and analytical scanning electron microscopy

Defect Recognition and Image Processing in Semiconductors 1997 ◽

10.1201/9781315140810-45 ◽

2017 ◽

pp. 221-224

Author(s):

T. Boeck ◽

K. Schmidt ◽

A. Gerlitzke ◽

P.-M. Wilde

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Analytical Scanning Electron Microscopy ◽

Scanning Electron

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Atomic force microscopy as a suitable technique for surface characterization of activated composite membranes for metal ion facilitated transport

Applied Physics A ◽

10.1007/s00339-006-3609-x ◽

2006 ◽

Vol 84 (3) ◽

pp. 277-284 ◽

Author(s):

J. Macanás ◽

L. Palacio ◽

P. Prádanos ◽

A. Hernández ◽

M. Muñoz

Keyword(s):

Atomic Force Microscopy ◽

Metal Ion ◽

Surface Characterization ◽

Composite Membranes ◽

Facilitated Transport ◽

Force Microscopy ◽

Atomic Force ◽

Suitable Technique

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Surface Characterization of Plasma-treated Eucalyptus Alkaline Peroxide Mechanical Pulp using Electronic Spectroscopy Chemical Analysis and Atomic Force Microscopy

BioResources ◽

10.15376/biores.13.2.3500-3510 ◽

2018 ◽

Vol 13 (2) ◽

Author(s):

Chongxing Huang ◽

Yuan Zhao ◽

Ying Liu ◽

Yizhao Chen ◽

Cuicui Li ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Chemical Analysis ◽

Surface Characterization ◽

Electronic Spectroscopy ◽

Mechanical Pulp ◽

Force Microscopy ◽

Alkaline Peroxide ◽

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Micromorphological characterization of polymer-oxide nanocomposite thin films by atomic force microscopy and fractal geometry analysis

Progress in Organic Coatings ◽

10.1016/j.porgcoat.2015.07.024 ◽

2015 ◽

Vol 89 ◽

pp. 50-56 ◽

Author(s):

Ştefan Ţălu ◽

Niranjan Patra ◽

Marco Salerno

Keyword(s):

Atomic Force Microscopy ◽

Fractal Geometry ◽

Force Microscopy ◽

Atomic Force ◽

Nanocomposite Thin Films ◽

Geometry Analysis

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Electrical characterization of oxygen-induced nanosized ripples on aluminum thin films by conductive atomic force microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2005.07.245 ◽

2006 ◽

Vol 243 (1) ◽

pp. 16-19 ◽

Author(s):

P. Mishra ◽

P. Karmakar ◽

D. Ghose

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

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Surface characterization of human hair by atomic force microscopy in the imaging and F-d modes

International Journal of Cosmetic Science ◽

10.1046/j.1467-2494.2001.00080.x ◽

2001 ◽

Vol 23 (3) ◽

pp. 165-174 ◽

Author(s):

J. Blach ◽

W. Loughlin ◽

G. Watson ◽

S. Myhra

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

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Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

Analytical and Bioanalytical Chemistry ◽

10.1007/s00216-012-6419-3 ◽

2012 ◽

Vol 405 (5) ◽

pp. 1463-1478 ◽

Author(s):

Daniele Passeri ◽

Marco Rossi ◽

Emanuela Tamburri ◽

Maria Letizia Terranova

Keyword(s):

Atomic Force Microscopy ◽

Mechanical Characterization ◽

Polymeric Thin Films ◽

Force Microscopy ◽

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Theoretical analysis of the atomic force microscopy characterization of columnar thin films

Ultramicroscopy ◽

10.1016/s0304-3991(02)00159-6 ◽

2003 ◽

Vol 94 (1) ◽

pp. 19-29 ◽

Author(s):

Petr Klapetek ◽

Ivan Ohlı́dal

Keyword(s):

Atomic Force Microscopy ◽

Theoretical Analysis ◽

Force Microscopy ◽

Atomic Force ◽

Microscopy Characterization ◽

Atomic Force Microscopy Characterization

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Electrical characterization of grain boundaries of CZTS thin films using conductive atomic force microscopy techniques

Materials Research Bulletin ◽

10.1016/j.materresbull.2015.05.002 ◽

2015 ◽

Vol 70 ◽

pp. 373-378 ◽

Author(s):

N. Muhunthan ◽

Om Pal Singh ◽

Vijaykumar Toutam ◽

V.N. Singh

Keyword(s):

Atomic Force Microscopy ◽

Grain Boundaries ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force ◽

Czts Thin Films ◽

Microscopy Techniques

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Surface Characterization of Collagen Films by Atomic Force Microscopy

XII Mediterranean Conference on Medical and Biological Engineering and Computing 2010 - IFMBE Proceedings ◽

10.1007/978-3-642-13039-7_154 ◽

2010 ◽

pp. 612-615 ◽

Author(s):

A. Stylianou ◽

S. B. Kontomaris ◽

M. Kyriazi ◽

D. Yova

Keyword(s):

Atomic Force Microscopy ◽

Surface Characterization ◽

Force Microscopy ◽

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