Micromorphological characterization of polymer-oxide nanocomposite thin films by atomic force microscopy and fractal geometry analysis

2015 ◽  
Vol 89 ◽  
pp. 50-56 ◽  
Author(s):  
Ştefan Ţălu ◽  
Niranjan Patra ◽  
Marco Salerno
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Fractal Geometry ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocomposite Thin Films ◽  
Geometry Analysis

Mechanical characterization of polymeric thin films by atomic force microscopy based techniques

2012 ◽  
Vol 405 (5) ◽  
pp. 1463-1478 ◽  
Author(s):  
Daniele Passeri ◽  
Marco Rossi ◽  
Emanuela Tamburri ◽  
Maria Letizia Terranova
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Mechanical Characterization ◽  
Polymeric Thin Films ◽  
Force Microscopy ◽  
Atomic Force

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

2004 ◽  
Vol 20-21 ◽  
pp. 611-616
Author(s):  
José M. Barandiarán ◽  
Iñaki Orue ◽  
M.L. Fdez-Gubieda ◽  
A. García Prieto
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Force Microscopy ◽  
Atomic Force

Fabrication and Characterization of Polyaniline–ZnO Hybrid Nanocomposite Thin Films

2008 ◽  
Vol 8 (4) ◽  
pp. 1757-1761 ◽  
Author(s):  
Ajeet Kaushik ◽  
Jitendra Kumar ◽  
M. K. Tiwari ◽  
R. Khan ◽  
B. D. Malhotra ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocomposite Thin Films ◽  
Scanning Electron

Polyaniline (PANI)–ZnO nanocomposite thin film has been successfully fabricated on glass substrates by using vacuum deposition technique. The as-grown PANI–ZnO nanocomposite thin films have been characterized using X-ray diffraction, Scanning Electron Microscopy, Atomic Force Microscopy, UV-visible spectrophotometer and Fourier Transform Infrared (FTIR) spectroscopy, respectively. X-ray diffraction of as-grown film shows the reflection of ZnO nanoparticles along with a broad peak of PANI. The surface morphology of nanocomposite films has been investigated using scanning electron microscopy and atomic force microscopy. The hypsochromic shift of the UV absorption band corresponding to π–π* transition in polymeric chain of PANI and a band at 504 cm –1 due to ZnO nanoparticles has been observed in the FTIR spectra. The hydrogen bonding between the imine group of PANI and ZnO nanoparticle has been confirmed from the presence of the absorbance band at 1151 cm–1 in the FTIR spectra of the nanocomposite thin films.

Nanometer-Scale Characterization of Ferroelectric Polymer Thin Films by Variable-Temperature Atomic Force Microscopy

2000 ◽  
Vol 39 (Part 1, No. 6B) ◽  
pp. 3830-3833 ◽  
Author(s):  
Takeshi Fukuma ◽  
Kei Kobayashi ◽  
Toshihisa Horiuchi ◽  
Hirofumi Yamada ◽  
Kazumi Matsushige
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Variable Temperature ◽  
Polymer Thin Films ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Ferroelectric Polymer ◽  
Atomic Force ◽  
Scale Characterization

Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

2013 ◽  
Vol 210 (11) ◽  
pp. 2416-2422 ◽  
Author(s):  
Daniele Pelliccia ◽  
Sasikaran Kandasamy ◽  
Michael James
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force
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