Characterization of interfacial layers and surface roughness using spectroscopic reflectance, spectroscopic ellipsometry, and atomic force microscopy

2002 ◽  
Author(s):  
Ray J. Hoobler ◽  
Rahul Korlahalli ◽  
Ed Boltich ◽  
Joe Serafin
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Spectroscopic Ellipsometry ◽  
Interfacial Layers ◽  
Force Microscopy ◽  
Atomic Force

Characterization of Healthy and Fluorotic Enamel by Atomic Force Microscopy

2010 ◽  
Vol 16 (5) ◽  
pp. 531-536 ◽  
Author(s):  
Verónica Zavala-Alonso ◽  
Gabriel A. Martínez-Castanon ◽  
Nuria Patiño-Marín ◽  
Humberto Terrones ◽  
Kenneth Anusavice ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Depth Profile ◽  
Positive Association ◽  
Clinical Findings ◽  
Mean Values ◽  
Force Microscopy ◽  
Atomic Force ◽  
The Mean

AbstractThe aim was to characterize the external structure, roughness, and absolute depth profile (ADP) of fluorotic enamel compared with healthy enamel. Eighty extracted human molars were classified into four groups [TFI: 0, control (C); 1–3, mild (MI); 4–5, moderate (MO); 6–9, severe fluorosis (S)] according to the Thylstrup-Fejerskov Index (TFI). All samples were analyzed by atomic force microscopy.The mean values of enamel surface roughness (ESR) in nm were: Group C, 92.6; Group MI, 188.8; Group MO, 246.9; and Group S, 532.2. The mean values of absolute depth profile in nm were: C, 1,065.7; MI, 2,360.7; MO, 2,536.7; and S, 6,146.2. The differences between mean ESR and mean ADP among groups were statistically significant (p < 0.05). This structural study confirms at the nanometer level that there is a positive association between fluorosis severity, ESR, and ADP, and there is an association with the clinical findings of fluorosis measured by TFI as well.

Surface Roughness Characterization of ZnO: TiO2-Organic Blended Solar Cells Layers by Atomic Force Microscopy and Fractal Analysis

2014 ◽  
Vol 13 (03) ◽  
pp. 1450020 ◽  
Author(s):  
Ştefan Ţălu ◽  
Sebastian Stach ◽  
Muhammad Ikram ◽  
Dinesh Pathak ◽  
Tomas Wagner ◽  
...  
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Solar Cells ◽  
Fractal Analysis ◽  
Surface Characterization ◽  
Surface Characteristics ◽  
Statistical Parameters ◽  
Force Microscopy ◽  
Atomic Force

The objective of this work is to quantitatively characterize the 3D complexity of ZnO : TiO 2-organic blended solar cells layers by atomic force microscopy and fractal analysis. ZnO : TiO 2-organic blended solar cells layers were investigated by AFM in tapping-mode in air, on square areas of 25 μm2. A detailed methodology for ZnO : TiO 2-organic blended solar cells layers surface fractal characterization, which may be applied for AFM data, is presented. Detailed surface characterization of the surface topography was obtained using statistical parameters, according with ISO 25178-2: 2012. The fractal dimensions Df values (all with average ± standard deviation), obtained with morphological envelopes method, for: blend D1 ( P 3 HT : PCBM : ZnO : TiO 2 blend with ratio 1:0.35:0.175:0.175 mg in 1 ml of Chlorobenzene) is Df = 2.55 ± 0.01; and for blend D2 ( P 3 HT : PCBM : ZnO : TiO 2 blend with ratio 1:0.55:0.075:0.075 mg in 1 ml of Chlorobenzene) is Df = 2.45 ± 0.01. Denoting the ratios in 1 ml of Chlorobenzene with D1 and D2 articles. The 3D surface roughness of samples revealed a fractal structure at nanometer scale. Fractal and AFM analysis may assist manufacturers in developing ZnO : TiO 2-organic blended solar cells layers with better surface characteristics and provides different yet complementary information to that offered by traditional surface statistical parameters.

A COMPARISON BETWEEN THE ATOMIC FORCE MICROSCOPY AND X-RAY REFLECTIVITY ON THE CHARACTERIZATION OF SURFACE ROUGHNESS

2003 ◽  
Vol 02 (04n05) ◽  
pp. 343-348 ◽  
Author(s):  
CHIH-HAO LEE ◽  
WEN-YEN PEN ◽  
MING-ZHE LIN ◽  
KUAN-LI YU ◽  
JEN-CHUNG HSUEH
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Power Spectra ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Roughness Exponent ◽  
Buried Layer

Atomic force microscopy and X-ray reflectivity methods are used to characterize a surface morphology which includes the information of rms roughness, roughness exponent, and the height–height correlation length. Two major reasons to interpret the discrepancy of rms roughness data measured by AFM and X-ray reflectivity are (1) the bandpass of power spectra density is different and (2) the X-ray reflectivity probes the high density buried layer.

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