A lightweight detector based on attention mechanism for aluminum strip surface defect detection

2022 ◽  
Vol 136 ◽  
pp. 103585
Author(s):  
Zhuxi MA ◽  
Yibo Li ◽  
Minghui Huang ◽  
Qianbin Huang ◽  
Jie Cheng ◽  
...  
2019 ◽  
Vol 47 (4) ◽  
pp. 765-774 ◽  
Author(s):  
Pavel Kostenetskiy ◽  
Rustem Alkapov ◽  
Nikita Vetoshkin ◽  
Roman Chulkevich ◽  
Ilya Napolskikh ◽  
...  

2021 ◽  
Vol 33 (6) ◽  
pp. 920-928
Author(s):  
Meijun Sun ◽  
Chaozhang Lyu ◽  
Yahong Han ◽  
Sen Li ◽  
Zheng Wang

2021 ◽  
Vol 70 ◽  
pp. 1-13
Author(s):  
Lisha Cui ◽  
Xiaoheng Jiang ◽  
Mingliang Xu ◽  
Wanqing Li ◽  
Pei Lv ◽  
...  

2021 ◽  
pp. 1-18
Author(s):  
Hui Liu ◽  
Boxia He ◽  
Yong He ◽  
Xiaotian Tao

The existing seal ring surface defect detection methods for aerospace applications have the problems of low detection efficiency, strong specificity, large fine-grained classification errors, and unstable detection results. Considering these problems, a fine-grained seal ring surface defect detection algorithm for aerospace applications is proposed. Based on analysis of the stacking process of standard convolution, heat maps of original pixels in the receptive field participating in the convolution operation are quantified and generated. According to the generated heat map, the feature extraction optimization method of convolution combinations with different dilation rates is proposed, and an efficient convolution feature extraction network containing three kinds of dilated convolutions is designed. Combined with the O-ring surface defect features, a multiscale defect detection network is designed. Before the head of multiscale classification and position regression, feature fusion tree modules are added to ensure the reuse and compression of the responsive features of different receptive fields on the same scale feature maps. Experimental results show that on the O-rings-3000 testing dataset, the mean condition accuracy of the proposed algorithm reaches 95.10% for 5 types of surface defects of aerospace O-rings. Compared with RefineDet, the mean condition accuracy of the proposed algorithm is only reduced by 1.79%, while the parameters and FLOPs are reduced by 35.29% and 64.90%, respectively. Moreover, the proposed algorithm has good adaptability to image blur and light changes caused by the cutting of imaging hardware, thus saving the cost.


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