Surface analysis by gas cluster ion beam XPS and ToF-SIMS tandem MS of 2-mercaptobenzoxazole corrosion inhibitor for brass

2021 ◽  
Vol 182 ◽  
pp. 109269
Author(s):  
Matjaž Finšgar
Keyword(s):  
Corrosion Inhibitor ◽  
Surface Analysis ◽  
Ion Beam ◽  
Tandem Ms ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis

2019 ◽  
Vol 40 (9) ◽  
pp. 877-881 ◽  
Author(s):  
Sang Ju Lee ◽  
Chang Min Choi ◽  
Boo Ki Min ◽  
Ji Young Baek ◽  
Jae Yeong Eo ◽  
...  
Keyword(s):  
Ion Beam ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion ◽  
Sims Analysis ◽  
Gas Cluster Ion Beam

TOF-SIMS study of polyester/melamine resin with Ar gas cluster ion beam

2014 ◽  
Vol 46 (S1) ◽  
pp. 100-104 ◽  
Author(s):  
S. Nishinomiya ◽  
K. Toshin ◽  
S. Hayashi ◽  
K. Iuchi ◽  
N. Se ◽  
...  
Keyword(s):  
Ion Beam ◽  
Melamine Resin ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

scholarly journals Ar-gas cluster ion beam in ToF-SIMS for peptide and protein analysis

2020 ◽  
Vol 15 (2) ◽  
pp. 021011 ◽  
Author(s):  
Jin Gyeong Son ◽  
Sohee Yoon ◽  
Hyun Kyung Shon ◽  
Jeong Hee Moon ◽  
Sunho Joh ◽  
...  
Keyword(s):  
Ion Beam ◽  
Protein Analysis ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering

The Analyst ◽  
2016 ◽  
Vol 141 (8) ◽  
pp. 2523-2533 ◽  
Author(s):  
Yi-Hsuan Chu ◽  
Hua-Yang Liao ◽  
Kang-Yi Lin ◽  
Hsun-Yun Chang ◽  
Wei-Lun Kao ◽  
...  
Keyword(s):  
Steady State ◽  
Depth Profile ◽  
Mass Spectroscopy ◽  
Ion Beam ◽  
Depth Profiles ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion ◽  
Sims Depth Profile

The Ar2500+ and O2+ cosputter in ToF-SIMS depth profiles retained >95% molecular ion intensity in the steady-state.

scholarly journals ToF-SIMS of OLED materials using argon gas cluster ion Beam: A promising approach for OLED inspection

2020 ◽  
Vol 507 ◽  
pp. 144887 ◽  
Author(s):  
Ji Young Baek ◽  
Chang Min Choi ◽  
Sang Ju Lee ◽  
Boo Ki Min ◽  
Hwa Seung Kang ◽  
...  
Keyword(s):  
Ion Beam ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam
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