scholarly journals ToF-SIMS of OLED materials using argon gas cluster ion Beam: A promising approach for OLED inspection

2020 ◽  
Vol 507 ◽  
pp. 144887 ◽  
Author(s):  
Ji Young Baek ◽  
Chang Min Choi ◽  
Sang Ju Lee ◽  
Boo Ki Min ◽  
Hwa Seung Kang ◽  
...  
Keyword(s):  
Ion Beam ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

Development of an Argon Gas Cluster Ion Beam for ToF‐SIMS Analysis

2019 ◽  
Vol 40 (9) ◽  
pp. 877-881 ◽  
Author(s):  
Sang Ju Lee ◽  
Chang Min Choi ◽  
Boo Ki Min ◽  
Ji Young Baek ◽  
Jae Yeong Eo ◽  
...  
Keyword(s):  
Ion Beam ◽  
Argon Gas ◽  
Tof Sims ◽  
Cluster Ion ◽  
Sims Analysis ◽  
Gas Cluster Ion Beam

XPS depth profiling of an ultrathin bioorganic film with an argon gas cluster ion beam

2016 ◽  
Vol 11 (2) ◽  
pp. 029603 ◽  
Author(s):  
Paul M. Dietrich ◽  
Carolin Nietzold ◽  
Matthias Weise ◽  
Wolfgang E. S. Unger ◽  
Saad Alnabulsi ◽  
...  
Keyword(s):  
Ion Beam ◽  
Depth Profiling ◽  
Argon Gas ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam

TOF-SIMS study of polyester/melamine resin with Ar gas cluster ion beam

2014 ◽  
Vol 46 (S1) ◽  
pp. 100-104 ◽  
Author(s):  
S. Nishinomiya ◽  
K. Toshin ◽  
S. Hayashi ◽  
K. Iuchi ◽  
N. Se ◽  
...  
Keyword(s):  
Ion Beam ◽  
Melamine Resin ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

scholarly journals Ar-gas cluster ion beam in ToF-SIMS for peptide and protein analysis

2020 ◽  
Vol 15 (2) ◽  
pp. 021011 ◽  
Author(s):  
Jin Gyeong Son ◽  
Sohee Yoon ◽  
Hyun Kyung Shon ◽  
Jeong Hee Moon ◽  
Sunho Joh ◽  
...  
Keyword(s):  
Ion Beam ◽  
Protein Analysis ◽  
Tof Sims ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Ar Gas

Quantitative analysis of lipids with argon gas cluster ion beam secondary ion mass spectrometry

2014 ◽  
Vol 46 (12-13) ◽  
pp. 1129-1132
Author(s):  
Makiko Fujii ◽  
Shunichirou Nakagawa ◽  
Toshio Seki ◽  
Takaaki Aoki ◽  
Jiro Matsuo
Keyword(s):  
Mass Spectrometry ◽  
Quantitative Analysis ◽  
Secondary Ion Mass Spectrometry ◽  
Ion Beam ◽  
Argon Gas ◽  
Ion Mass Spectrometry ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Secondary Ion

Removal of Organic Contamination from Graphene with a Controllable Mass-Selected Argon Gas Cluster Ion Beam

2015 ◽  
Vol 119 (31) ◽  
pp. 17836-17841 ◽  
Author(s):  
Bonnie J. Tyler ◽  
Barry Brennan ◽  
Helena Stec ◽  
Trupti Patel ◽  
Ling Hao ◽  
...  
Keyword(s):  
Ion Beam ◽  
Organic Contamination ◽  
Argon Gas ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam
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