sims depth profile Recently Published Documents

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

Application of ‘Storing Matter’ technique in SIMS depth profile analysis

10.1016/j.nimb.2018.05.017 ◽

2019 ◽

Vol 450 ◽

pp. 153-156 ◽

Cited By ~ 1

Author(s):

M. Miśnik ◽

P. Konarski ◽

A. Zawada ◽

J. Ażgin

Keyword(s):

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

SIMS depth profile analysis of tribological coatings on curved surfaces: Influence of ion impact angle and take‐off angle on ion yield and on the quantitative analysis of chemical composition

10.1002/sia.6641 ◽

2019 ◽

Vol 51 (7) ◽

pp. 703-711

Author(s):

Kirsten Ingolf Schiffmann

Keyword(s):

Quantitative Analysis ◽

Chemical Composition ◽

Depth Profile ◽

Profile Analysis ◽

Impact Angle ◽

Curved Surfaces ◽

Depth Profile Analysis ◽

Tribological Coatings ◽

Ion Impact ◽

Improvement of the gas cluster ion beam-(GCIB)-based molecular secondary ion mass spectroscopy (SIMS) depth profile with O2+ cosputtering

The Analyst ◽

10.1039/c5an02677f ◽

2016 ◽

Vol 141 (8) ◽

pp. 2523-2533 ◽

Cited By ~ 5

Author(s):

Yi-Hsuan Chu ◽

Hua-Yang Liao ◽

Kang-Yi Lin ◽

Hsun-Yun Chang ◽

Wei-Lun Kao ◽

...

Keyword(s):

Steady State ◽

Depth Profile ◽

Mass Spectroscopy ◽

Ion Beam ◽

Depth Profiles ◽

Tof Sims ◽

Cluster Ion ◽

Gas Cluster Ion Beam ◽

Secondary Ion ◽

The Ar2500+ and O2+ cosputter in ToF-SIMS depth profiles retained >95% molecular ion intensity in the steady-state.

Core-shell structure of fly ash particles - SIMS depth profile analysis

10.1002/sia.5143 ◽

2012 ◽

Vol 45 (1) ◽

pp. 592-595 ◽

Cited By ~ 4

Author(s):

P. Konarski ◽

A. Zawada ◽

D. Kowalczyk ◽

K. Juda-Rezler

Keyword(s):

Fly Ash ◽

Depth Profile ◽

Shell Structure ◽

Profile Analysis ◽

Core Shell ◽

Depth Profile Analysis ◽

Core Shell Structure ◽

The Eighth International Conference on Advanced Semiconductor Devices and Microsystems ◽

SIMS depth profile characterisation of InAlN/GaN structures

10.1109/asdam.2010.5666363 ◽

2010 ◽

Author(s):

A. Vincze ◽

J. Kovac ◽

H. Behmenburg ◽

R. Srnanek ◽

F. Uherek ◽

...

Keyword(s):

Depth Profile ◽

SIMS depth profile analysis of particles collected in an urban environment

10.1002/sia.3666 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 470-474 ◽

Cited By ~ 2

Author(s):

P. Konarski ◽

K. Kaczorek ◽

B. Balcerzak ◽

J. Haluszka ◽

M. Scibor ◽

...

Keyword(s):

Urban Environment ◽

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽

Cold plasma cleaning of copper and aluminum tested by SIMS depth profile analysis

10.1002/sia.3655 ◽

2010 ◽

Vol 43 (1-2) ◽

pp. 612-617 ◽

Cited By ~ 2

Author(s):

P. Konarski ◽

T. Opalińska

Keyword(s):

Depth Profile ◽

Cold Plasma ◽

Profile Analysis ◽

Plasma Cleaning ◽

Depth Profile Analysis ◽

ToF-SIMS depth profile of the surface film on pure magnesium formed by immersion in pure water and the identification of magnesium hydride

Corrosion Science ◽

10.1016/j.corsci.2009.06.002 ◽

2009 ◽

Vol 51 (9) ◽

pp. 1883-1886 ◽

Cited By ~ 45

Author(s):

Antoine Seyeux ◽

Ming Liu ◽

Patrik Schmutz ◽

Guangling Song ◽

Andrej Atrens ◽

...

Keyword(s):

Depth Profile ◽

Surface Film ◽

Pure Water ◽

Magnesium Hydride ◽

Pure Magnesium ◽

Tof Sims ◽

SIMS depth profile analysis of sodium in silicon dioxide

Applied Surface Science ◽

10.1016/j.apsusc.2008.05.069 ◽

2008 ◽

Vol 255 (4) ◽

pp. 860-862 ◽

Cited By ~ 10

Author(s):

Y. Yamamoto ◽

N. Shimodaira

Keyword(s):

Silicon Dioxide ◽

Depth Profile ◽

Profile Analysis ◽

Depth Profile Analysis ◽