Bias-induced migration of ionized donors in amorphous oxide semiconductor thin-film transistors with full bottom-gate and partial top-gate structures
2009 ◽
Vol 40
(1)
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pp. 181
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2011 ◽
Vol 29
(4)
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pp. 04D115
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2009 ◽
Vol 10
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pp. 1489-1496
2018 ◽
Vol 91
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pp. 307-312
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2012 ◽
Vol 43
(1)
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pp. 11-14
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