Hybrid low-pressure submerged membrane photoreactor for the removal of bisphenol A

Desalination ◽  
2007 ◽  
Vol 202 (1-3) ◽  
pp. 253-261 ◽  
Author(s):  
Sze Sze Chin ◽  
Tuti Mariana Lim ◽  
Ken Chiang ◽  
Anthony Gordon Fane
Keyword(s):  
2013 ◽  
Vol 52 (40-42) ◽  
pp. 7543-7551 ◽  
Author(s):  
Fatemeh Khazaali ◽  
Ali Kargari ◽  
Mohammad Rokhsaran

Author(s):  
Zhiquan Li ◽  
Congwei Luo ◽  
Fengxun Tan ◽  
Daoji Wu ◽  
Xuedong Zhai ◽  
...  

As an endocrine disruptor, bisphenol A (BPA) is a severe threat to human health. In this study, nitrate (NO3-) photolysis with a low-pressure UV lamp (LP-UV) was employed to degrade...


Author(s):  
L.H. Bolz ◽  
D.H. Reneker

The attack, on the surface of a polymer, by the atomic, molecular and ionic species that are created in a low pressure electrical discharge in a gas is interesting because: 1) significant interior morphological features may be revealed, 2) dielectric breakdown of polymeric insulation on high voltage power distribution lines involves the attack on the polymer of such species created in a corona discharge, 3) adhesive bonds formed between polymer surfaces subjected to such SDecies are much stronger than bonds between untreated surfaces, 4) the chemical modification of the surface creates a reactive surface to which a thin layer of another polymer may be bonded by glow discharge polymerization.


Author(s):  
Gert Ehrlich

The field ion microscope, devised by Erwin Muller in the 1950's, was the first instrument to depict the structure of surfaces in atomic detail. An FIM image of a (111) plane of tungsten (Fig.l) is typical of what can be done by this microscope: for this small plane, every atom, at a separation of 4.48Å from its neighbors in the plane, is revealed. The image of the plane is highly enlarged, as it is projected on a phosphor screen with a radius of curvature more than a million times that of the sample. Müller achieved the resolution necessary to reveal individual atoms by imaging with ions, accommodated to the object at a low temperature. The ions are created at the sample surface by ionization of an inert image gas (usually helium), present at a low pressure (< 1 mTorr). at fields on the order of 4V/Å.


Author(s):  
E. G. Rightor ◽  
G. P. Young

Investigation of neat polymers by TEM is often thwarted by their sensitivity to the incident electron beam, which also limits the usefulness of chemical and spectroscopic information available by electron energy loss spectroscopy (EELS) for these materials. However, parallel-detection EELS systems allow reduced radiation damage, due to their far greater efficiency, thereby promoting their use to obtain this information for polymers. This is evident in qualitative identification of beam sensitive components in polymer blends and detailed investigations of near-edge features of homopolymers.Spectra were obtained for a poly(bisphenol-A carbonate) (BPAC) blend containing poly(tetrafluoroethylene) (PTFE) using a parallel-EELS and a serial-EELS (Gatan 666, 607) for comparison. A series of homopolymers was also examined using parallel-EELS on a JEOL 2000FX TEM employing a LaB6 filament at 100 kV. Pure homopolymers were obtained from Scientific Polymer Products. The PTFE sample was commercial grade. Polymers were microtomed on a Reichert-Jung Ultracut E and placed on holey carbon grids.


2011 ◽  
pp. 053111130856
Author(s):  
Stephen Ritter
Keyword(s):  

2011 ◽  
pp. 062311292128
Author(s):  
Erika Gebel
Keyword(s):  

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