In-situ oxidation and annealing of hydrogenated diamond (100) surfaces studied by high resolution electron energy loss spectroscopy

In Situ Oxidation ◽

Resolution Electron ◽

Surface defects induced by in-situ annealing of hydrogenated polycrystalline diamond studied by high resolution electron energy loss spectroscopy

Diamond and Related Materials ◽

10.1016/j.diamond.2008.02.019 ◽

2008 ◽

Vol 17 (6) ◽

pp. 949-953 ◽

Cited By ~ 8

Author(s):

A. Lafosse ◽

M. Bertin ◽

Sh. Michaelson ◽

R. Azria ◽

R. Akhvlediani ◽

...

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Surface Defects ◽

Polycrystalline Diamond ◽

Resolution Electron ◽

In situ high resolution electron microscopy/electron energy loss spectroscopy observation of wetting of a Si surface by molten Al

Journal of Microscopy ◽

10.1046/j.1365-2818.2001.00905.x ◽

2001 ◽

Vol 203 (1) ◽

pp. 17-21 ◽

Cited By ~ 10

Author(s):

S. Tsukimoto ◽

S. Arai ◽

M. Konno ◽

T. Kamino ◽

K. Sasaki ◽

...

Keyword(s):

Electron Microscopy ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

High Resolution Electron Microscopy ◽

Resolution Electron ◽

Electron Energy Loss ◽

Spectroscopy Observation

In situ determination of electronic properties of clean GaAs(100) surfaces by high-resolution electron energy loss spectroscopy

Surface Science ◽

10.1016/0039-6028(92)90882-7 ◽

1992 ◽

Vol 271 (1-2) ◽

pp. 260-276 ◽

Cited By ~ 6

Author(s):

M. Noguchi ◽

K. Hirakawa ◽

T. Ikoma

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electronic Properties ◽

Electron Energy ◽

Resolution Electron ◽

Momentum- and space-resolved high-resolution electron energy loss spectroscopy of individual single-wall carbon nanotubes

Physical Review B ◽

10.1103/physrevb.95.195411 ◽

2017 ◽

Vol 95 (19) ◽

Cited By ~ 9

Author(s):

F. S. Hage ◽

T. P. Hardcastle ◽

A. J. Scott ◽

R. Brydson ◽

Q. M. Ramasse

Keyword(s):

Carbon Nanotubes ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Single Wall Carbon Nanotubes ◽

Single Wall Carbon ◽

Resolution Electron ◽

Adsorption of Fluorinated C60on the Si(111)-(7×7) Surface Studied by Scanning Tunneling Microscopy and High-Resolution Electron Energy Loss Spectroscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.41.245 ◽

2002 ◽

Vol 41 (Part 1, No. 1) ◽

pp. 245-249 ◽

Cited By ~ 9

Author(s):

Yasunori Fujikawa ◽

Jerzy T. Sadowski ◽

Kevin F. Kelly ◽

Koji S. Nakayama ◽

Edward T. Mickelson ◽

...

Keyword(s):

High Resolution ◽

Energy Loss ◽

Scanning Tunneling Microscopy ◽

Electron Energy ◽

Scanning Tunneling ◽

Tunneling Microscopy ◽

Resolution Electron ◽

Investigation of the space charge regime of epitaxially grown GaAs (100) by high-resolution electron energy-loss spectroscopy

Applied Surface Science ◽

10.1016/s0169-4332(96)00116-x ◽

1996 ◽

Vol 104-105 ◽

pp. 24-34 ◽

Cited By ~ 3

Author(s):

V.M. Polyakov ◽

A. Elbe ◽

J. Wu ◽

G.J. Lapeyre ◽

J.A. Schaefer

Keyword(s):

High Resolution ◽

Energy Loss ◽

Space Charge ◽

Electron Energy ◽

Resolution Electron ◽

ChemInform Abstract: Adsorption and Reaction of Formic Acid on NiO(100) Films on Mo(100): Temperature Programmed Desorption and High Resolution Electron Energy Loss Spectroscopy Studies.

ChemInform ◽

10.1002/chin.199317036 ◽

2010 ◽

Vol 24 (17) ◽

pp. no-no

Author(s):

C. M. TRUONG ◽

M.-C. WU ◽

D. W. GOODMAN

Keyword(s):

High Resolution ◽

Energy Loss ◽

Formic Acid ◽

Electron Energy ◽

Temperature Programmed Desorption ◽

Resolution Electron ◽

Temperature Programmed ◽

Spectroscopy Studies ◽

A nanoscale investigation on the influence of anodization parameters during plasma electrolytic oxidation of titanium by high-resolution electron energy loss spectroscopy

Applied Surface Science ◽

10.1016/j.apsusc.2021.151133 ◽

2021 ◽

pp. 151133

Author(s):

Luca Casanova ◽

Mattia Arosio ◽

Mohammad Taghi Hashemi ◽

MariaPia Pedeferri ◽

Gianluigi A. Botton ◽

...

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Plasma Electrolytic Oxidation ◽

Resolution Electron ◽

Electrolytic Oxidation ◽

Plasma Electrolytic ◽

Local bonding structures of SiO2 films on H-terminated Si(100) surfaces studied by using high-resolution electron energy loss spectroscopy

Applied Surface Science ◽

10.1016/s0169-4332(98)00049-x ◽

1998 ◽

Vol 130-132 ◽

pp. 192-196 ◽

Cited By ~ 7

Author(s):

Y. Nakagawa ◽

M. Higashi ◽

H. Ikeda ◽

S. Zaima ◽

Y. Yasuda

Keyword(s):

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Sio2 Films ◽

Resolution Electron ◽

Local Bonding ◽

Application of high‐resolution electron energy loss spectroscopy to the adsorption and the photoreaction of CH2I2 and CD3OD on a MoOx thin film

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579469 ◽

1995 ◽

Vol 13 (6) ◽

pp. 2689-2697 ◽

Cited By ~ 4

Author(s):

Hong He ◽

Junji Nakamura ◽

Naoki Takehiro ◽

Ken‐ichi Tanaka

Keyword(s):

Thin Film ◽

High Resolution ◽

Energy Loss ◽

Electron Energy ◽

Resolution Electron ◽