Simultaneous film thickness measurement and wall temperature assessment by Low-Coherence Interferometry

2013 ◽  
Vol 44 ◽  
pp. 512-519 ◽  
Author(s):  
Nicolas Borgetto ◽  
Frédéric André ◽  
Cédric Galizzi ◽  
Dany Escudié
Keyword(s):  
Film Thickness ◽  
Wall Temperature ◽  
Thickness Measurement ◽  
Low Coherence ◽  
Low Coherence Interferometry ◽  
Film Thickness Measurement

Nanoscale film thickness measurement based on weak measurement

2020 ◽  
Vol 91 (12) ◽  
pp. 123111
Author(s):  
Zirui Qin ◽  
Qinggang Liu ◽  
Chong Yue ◽  
Yaopu Lang ◽  
Xinglin Zhou
Keyword(s):  
Film Thickness ◽  
Thickness Measurement ◽  
Weak Measurement ◽  
Film Thickness Measurement

scholarly journals Interferometric Instrument for Thickness Measurement on Blown Films

Photonics ◽  
2021 ◽  
Vol 8 (7) ◽  
pp. 245
Author(s):  
Michele Norgia ◽  
Alessandro Pesatori
Keyword(s):  
Film Thickness ◽  
Temperature Compensation ◽  
Close Contact ◽  
Thickness Measurement ◽  
The Novel ◽  
Blown Films ◽  
Low Coherence ◽  
Real Time Measurement ◽  
Blown Film ◽  
Standard Techniques

Real-time measurement of plastic film thickness during production is extremely important to guarantee planarity of the final film. Standard techniques are based on capacitive measurements, in close contact with the film. These techniques require continuous calibration and temperature compensation, while their contact can damage the film. Different optical contactless techniques are described in literature, but none has found application to real production, due to the strong vibration of the films. We propose a new structure of low-coherence fiber interferometer able to measure blown film thickness during productions. The novel fiber-optic setup is a cross between an autocorrelator and a white light interferometer, taking the advantages of both approaches.

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