Use of the reflective background oriented schlieren technique to measure free surface deformations in a thin liquid layer non-uniformly heated from below
2020 ◽
Vol 1666
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pp. 012059
Keyword(s):
Keyword(s):
2008 ◽
Vol 35
(2-3)
◽
pp. 372-396
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Keyword(s):
1988 ◽
Vol 19
(8)
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pp. 1895-1898
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Keyword(s):
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2002 ◽
Vol 2002.8
(0)
◽
pp. 555-556
Keyword(s):
2000 ◽
Vol 2000.4
(0)
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pp. 253-254