scholarly journals Comparison of second-order serendipity and Lagrange tetrahedral elements for nonlinear explicit methods

2021 ◽  
Vol 190 ◽  
pp. 103532
Author(s):  
Kent T. Danielson ◽  
Robert S. Browning ◽  
Mark D. Adley
Author(s):  
Huimin Zhang ◽  
Runsen Zhang ◽  
Andrea Zanoni ◽  
Yufeng Xing ◽  
Pierangelo Masarati

AbstractA novel explicit three-sub-step time integration method is proposed. From linear analysis, it is designed to have at least second-order accuracy, tunable stability interval, tunable algorithmic dissipation and no overshooting behaviour. A distinctive feature is that the size of its stability interval can be adjusted to control the properties of the method. With the largest stability interval, the new method has better amplitude accuracy and smaller dispersion error for wave propagation problems, compared with some existing second-order explicit methods, and as the stability interval narrows, it shows improved period accuracy and stronger algorithmic dissipation. By selecting an appropriate stability interval, the proposed method can achieve properties better than or close to existing second-order methods, and by increasing or reducing the stability interval, it can be used with higher efficiency or stronger dissipation. The new method is applied to solve some illustrative wave propagation examples, and its numerical performance is compared with those of several widely used explicit methods.


Author(s):  
W. L. Bell

Disappearance voltages for second order reflections can be determined experimentally in a variety of ways. The more subjective methods, such as Kikuchi line disappearance and bend contour imaging, involve comparing a series of diffraction patterns or micrographs taken at intervals throughout the disappearance range and selecting that voltage which gives the strongest disappearance effect. The estimated accuracies of these methods are both to within 10 kV, or about 2-4%, of the true disappearance voltage, which is quite sufficient for using these voltages in further calculations. However, it is the necessity of determining this information by comparisons of exposed plates rather than while operating the microscope that detracts from the immediate usefulness of these methods if there is reason to perform experiments at an unknown disappearance voltage.The convergent beam technique for determining the disappearance voltage has been found to be a highly objective method when it is applicable, i.e. when reasonable crystal perfection exists and an area of uniform thickness can be found. The criterion for determining this voltage is that the central maximum disappear from the rocking curve for the second order spot.


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