Variational formulation of non-equilibrium void fraction

Author(s):  
Niccolo Giannetti ◽  
Moojoong Kim ◽  
Hiroaki Yoshimura ◽  
Kiyoshi Saito
1995 ◽  
Vol 154 (2) ◽  
pp. 183-192 ◽  
Author(s):  
V.A. Herrero ◽  
G. Guido-Lavalle ◽  
A. Clausse

Author(s):  
Edward A Kenik

Segregation of solute atoms to grain boundaries, dislocations, and other extended defects can occur under thermal equilibrium or non-equilibrium conditions, such as quenching, irradiation, or precipitation. Generally, equilibrium segregation is narrow (near monolayer coverage at planar defects), whereas non-equilibrium segregation exhibits profiles of larger spatial extent, associated with diffusion of point defects or solute atoms. Analytical electron microscopy provides tools both to measure the segregation and to characterize the defect at which the segregation occurs. This is especially true of instruments that can achieve fine (<2 nm width), high current probes and as such, provide high spatial resolution analysis and characterization capability. Analysis was performed in a Philips EM400T/FEG operated in the scanning transmission mode with a probe diameter of <2 nm (FWTM). The instrument is equipped with EDAX 9100/70 energy dispersive X-ray spectrometry (EDXS) and Gatan 666 parallel detection electron energy loss spectrometry (PEELS) systems. A double-tilt, liquid-nitrogen-cooled specimen holder was employed for microanalysis in order to minimize contamination under the focussed spot.


Author(s):  
Michel Le Bellac ◽  
Fabrice Mortessagne ◽  
G. George Batrouni

1978 ◽  
Vol 39 (C6) ◽  
pp. C6-541-C6-542
Author(s):  
B. Pannetier ◽  
J. P. Maneval

1978 ◽  
Vol 39 (C6) ◽  
pp. C6-500-C6-502 ◽  
Author(s):  
J. Bindslev Hansen ◽  
P. Jespersen ◽  
P. E. Lindelof
Keyword(s):  

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