AbstractIn this paper, we employ the nonlinear optical microscopies of coherent anti-Stokes Raman scattering spectroscopy, two-photon excitation fluorescence, and second harmonic generation to characterize the properties of two-dimensional (2D) materials. With these nonlinear optical microscopy methods, we can not only clearly observe the surface topography of 2D materials but also reveal the quality of 2D materials. These nonlinear optical microscopies offer great potential for characterization of the properties of 2D materials.
Enhanced optical Kerr effect method for a detailed characterization of the third-order nonlinearity of two-dimensional materials applied to graphene