In situ high-temperature X-ray diffraction analysis of Mg2Si formation kinetics via reaction of Mg films with Si single crystal substrates

2018 ◽  
Vol 94 ◽  
pp. 200-209 ◽  
Author(s):  
Ari S. Gordin ◽  
Kenneth H. Sandhage
CrystEngComm ◽  
2019 ◽  
Vol 21 (22) ◽  
pp. 3415-3419 ◽  
Author(s):  
Phumile Sikiti ◽  
Charl X. Bezuidenhout ◽  
Dewald P. van Heerden ◽  
Leonard J. Barbour

Structural evidence from in situ single-crystal X-ray diffraction analysis reveals flexibility in a new non-interpenetrated pillared-layer MOF that switches between a wide-pore and a narrow-pore form.


Author(s):  
Pawel Kuczera ◽  
Janusz Wolny ◽  
Walter Steurer

The structure of decagonal Al–Cu–Rh has been studied as a function of temperature byin-situsingle-crystal X-ray diffraction in order to contribute to the discussion on energy or entropy stabilization of quasicrystals. The experiments were performed at 293, 1223, 1153, 1083 and 1013 K. A common subset of 1460 unique reflections was used for the comparative structure refinements at each temperature. A comparison of the high-temperature datasets suggests that the best quasiperiodic ordering should exist between 1083 and 1153 K. However, neither the refined structures nor the phasonic displacement parameter vary significantly with temperature. This indicates that the phasonic contribution to entropy does not seem to play a major role in the stability of this decagonal phase in contrast to other kinds of structural disorder, which suggests that, in this respect, this decagonal phase would be similar to other complex intermetallic high-temperature phases.


2014 ◽  
Vol 70 (8) ◽  
pp. 773-775 ◽  
Author(s):  
Qisheng Lin ◽  
John D. Corbett

The EuAuGe-type CaAuSn phase has been synthesized and single-crystal X-ray diffraction analysis reveals that it has an orthorhombic symmetry (space groupImm2), witha= 4.5261 (7) Å,b= 7.1356 (11) Å andc= 7.8147 (11) Å. The structure features puckered layers that are connected by homoatomic Au—Au and Sn—Sn interlayer bonds. This structure is one of the two parent structures of its high-temperature polymorph (ca873 K), which is an intergrowth structure of the EuAuGe- and SrMgSi-type structures in a 2:3 ratio.


2000 ◽  
Vol 64 (6) ◽  
pp. 983-993 ◽  
Author(s):  
A. Pavese ◽  
R. Bocchio ◽  
G. Ivaldi

AbstractIn situ high temperature single crystal X-ray diffraction (XRD) experiments have been performed on a chemically quasi-ideal omphacite sample up to 1000°C. The lattice parameters were studied as a function of temperature, and their thermal expansion coefficients determined. The b and c cell edges show discontinuities as a function of temperature which are interpreted here in terms of intracrystalline cation diffusion processes. Structure refinements have been carried out using data collected at room temperature, at 800°C and at ambient conditions after cooling. The structural behaviour as a function of temperature of chemically quasi-ideal omphacites is compared with those of jadeite and diopside.


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