Boron oxide encapsulated Bridgman growth of high-purity high-resistivity cadmium telluride crystals

2004 ◽  
Vol 260 (3-4) ◽  
pp. 291-297 ◽  
Author(s):  
M. Zha ◽  
A. Zappettini ◽  
F. Bissoli ◽  
L. Zanotti ◽  
V. Corregidor ◽  
...  
1982 ◽  
Vol 16 ◽  
Author(s):  
A. Musa ◽  
J.P. Ponpon ◽  
M. Hage-Ali

ABSTRACTOhmic and rectifying contacts on high resistivity etched P-type cadmium telluride have been studied in order to produce diode structures.For this,we have first investigated the properties of gold contacts obtained by chemical reactions of CdTe dippedin gold chloride.Both electrical characterization and structure have been analyzed as a function of the experimental conditions of the contact deposition.The results can be interpreted in terms of a current flow enhanced by tunnelling through the Au-CdTe junction and related to the structure of the interface a few tens of nanometer below the gold contact. In addition,several rectifying contacts have been investigated , in order to achieve a structure having low leakage current.


2008 ◽  
Vol 47 (9) ◽  
pp. 7052-7055 ◽  
Author(s):  
Hideharu Matsuura ◽  
Hirokazu Yanase ◽  
Miyuki Takahashi

1974 ◽  
Vol 45 (6) ◽  
pp. 2759-2765 ◽  
Author(s):  
R. Triboulet ◽  
Y. Marfaing ◽  
A. Cornet ◽  
P. Siffert

1974 ◽  
Vol 3 (1) ◽  
pp. 155-170 ◽  
Author(s):  
R. Farrell ◽  
G. Entine ◽  
F. Wilson ◽  
F. V. Wald

Author(s):  
Johan Lauwaert

Abstract Very often Deep Level Transient Spectroscopy (DLTS) specimens deviate from ideal textbook examples making the interpretation of spectra a huge challenge. This challenge introduces inaccurate estimates of the emission signatures and the lack of appropriate estimates for the concentrations of the observed trap levels. In this work it is shown with the example of high-purity germanium that Technology computer aided design including symbolic differentiation provides the necessary numerical stability over a wide temperature range to model DLTS spectra. Moreover this high-purity germanium is a quasi intrinsic semiconductor for which it is well-known that the original small signal theory can introduce strong errors. It is furthermore shown that the parasitic impact of fractional filling and high resistivity material can be modelled and that these modelled spectra can in the future assist the interpretation of experimental results.


1990 ◽  
Vol 101 (1-4) ◽  
pp. 859-863 ◽  
Author(s):  
K. Suzuki ◽  
S. Seto ◽  
A. Tanaka ◽  
M. Kawashima

1987 ◽  
Vol 43 (1) ◽  
pp. 47-52 ◽  
Author(s):  
B. Biglari ◽  
M. Samimi ◽  
M. Hage-Ali ◽  
P. Siffert

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