Silicene, the honeycomb 2D structured silicon, is addressed as cousin of graphene, by many researchers. Its unique properties draw the attention of researchers round the globe. Electrical properties of silicene are also reported by other researchers. In this paper, we estimate electrical resistivity, electrical conductivity and Lorenz number for silicene within the temperature range from 100 K to 500 K. Variation of these parameters with respect to sample size is also reported. The novelty of our work is that till now the Lorenz number and variation of electrical properties within this wide temperature range of 100–500 K for silicene have not yet been reported. We also observed that with variation of sample sizes electrical resistance of silicene sheet remains unaffected whereas the other electrical properties vary. This is due to tunneling effect of semiconductors, which is due to uneven distribution of atoms (buckled structure) in planes.