Critical phenomena in canonical spin glass AuMn from Hall effect measurements

2007 ◽  
Vol 310 (2) ◽  
pp. 1526-1528 ◽  
Author(s):  
T. Taniguchi ◽  
T. Yamazaki ◽  
K. Yamanaka ◽  
Y. Tabata ◽  
S. Kawarazaki
2004 ◽  
Vol 67 (1) ◽  
pp. 123-129 ◽  
Author(s):  
P Pureur ◽  
F. Wolff Fabris ◽  
J Schaf ◽  
I. A Campbell

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-1057-C8-1058
Author(s):  
S. Murayama ◽  
Y. Miyako ◽  
E. F. Wassermann

2018 ◽  
Vol 31 (3) ◽  
pp. 20
Author(s):  
Sarmad M. M. Ali ◽  
Alia A.A. Shehab ◽  
Samir A. Maki

In this study, the ZnTe thin films were deposited on a glass substrate at a thickness of 400nm using vacuum evaporation technique (2×10-5mbar) at RT. Electrical conductivity and Hall effect measurements have been investigated as a function of variation of the doping ratios (3,5,7%) of the Cu element on the thin ZnTe films. The temperature range of (25-200°C) is to record the electrical conductivity values. The results of the films have two types of transport mechanisms of free carriers with two values of activation energy (Ea1, Ea2), expect 3% Cu. The activation energy (Ea1) increased from 29meV to 157meV before and after doping (Cu at 5%) respectively. The results of Hall effect measurements of ZnTe , ZnTe:Cu films show that all films were (p-type), the carrier concentration (1.1×1020 m-3) , Hall mobility (0.464m2/V.s) for pure ZnTe film, increases the carrier concentration (6.3×1021m-3) Hall mobility (2m2/V.s) for doping (Cu at 3%) film, but  decreases by increasing Cu concentration.


2015 ◽  
Vol 212 (7) ◽  
pp. 1487-1493 ◽  
Author(s):  
Woong-Jhae Lee ◽  
Hyung Joon Kim ◽  
Egon Sohn ◽  
Hoon Min Kim ◽  
Tai Hoon Kim ◽  
...  

1997 ◽  
Vol 79 (21) ◽  
pp. 4246-4249 ◽  
Author(s):  
D. R. Leadley ◽  
R. J. Nicholas ◽  
D. K. Maude ◽  
A. N. Utjuzh ◽  
J. C. Portal ◽  
...  

2008 ◽  
Vol 38 (1) ◽  
pp. 147-155 ◽  
Author(s):  
C. A. C. Sequeira ◽  
D. M. F. Santos

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