Structural Characterization of Laser Bonded Sapphire Wafers Using a Titanium Absorber Thin Film

2015 ◽  
Vol 31 (5) ◽  
pp. 484-488 ◽  
Author(s):  
A. de Pablos-Martín ◽  
S. Tismer ◽  
Th. Höche
Keyword(s):  
Thin Film ◽  
Structural Characterization

Magnetic and structural characterization of Ni(1−x)Gex thin film

2015 ◽  
Vol 373 ◽  
pp. 164-168 ◽  
Author(s):  
S. Kazan ◽  
B. Kocaman ◽  
A. Parabaş ◽  
F. Yıldız ◽  
B. Aktaş
Keyword(s):  
Thin Film ◽  
Structural Characterization

scholarly journals Structural Characterization of (Re)Bco Layer Deposited by Pld and Mocvd Techniques

2014 ◽  
Vol 22 (341) ◽  
pp. 137-142
Author(s):  
Jozef Mišík ◽  
Marcela Pekarčíková ◽  
Jozef Janovec
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Structural Characterization ◽  
Structural Defects ◽  
Chemical Heterogeneity ◽  
Edx Analysis

Abstract (RE)BCO thin films prepared by PLD and MOCVD techniques were investigated to characterize structural defects - outgrowths in thin film. For this purpose SEM, EDX analysis and LSCM were used. Outgrowths are often penetrating into the thin films. Evident differences in chemical heterogeneity, outgrowth morphology and outgrowths density between PLD and MOCVD thin films were proven in this study.

scholarly journals Preparation and structural characterization of SnO2 and GeO2 methanol steam reforming thin film model catalysts by (HR)TEM

2010 ◽  
Vol 122 (2-3) ◽  
pp. 623-629 ◽  
Author(s):  
Harald Lorenz ◽  
Qian Zhao ◽  
Stuart Turner ◽  
Oleg I. Lebedev ◽  
Gustaaf Van Tendeloo ◽  
...  
Keyword(s):  
Thin Film ◽  
Structural Characterization ◽  
Steam Reforming ◽  
Model Catalysts ◽  
Methanol Steam Reforming ◽  
Film Model ◽  
Thin Film Model

scholarly journals Optical and structural characterization of ZnSe thin film fabricated by thermal vapour deposition technique

2017 ◽  
Vol 4 (5) ◽  
pp. 1095-1121 ◽  
Author(s):  
Mohammed Tareque Chowdhury ◽  
◽  
Md. Abdullah Zubair ◽  
Hiroaki Takeda ◽  
Kazi Md. Amjad Hussain ◽  
...  
Keyword(s):  
Thin Film ◽  
Structural Characterization ◽  
Vapour Deposition ◽  
Deposition Technique

Structural characterization of a Cu(II) thin-film aging in a Cu-nitrate solution

2009 ◽  
Vol 255 (13-14) ◽  
pp. 6607-6611 ◽  
Author(s):  
F.O. Méar ◽  
M. Essi ◽  
P. Sistat ◽  
M.-F. Guimon ◽  
D. Gonbeau ◽  
...  
Keyword(s):  
Thin Film ◽  
Structural Characterization ◽  
Nitrate Solution
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