Radiative emission analysis of Sm3+ ions doped borosilicate glasses for visible orange photonic devices

2021 ◽  
Vol 572 ◽  
pp. 121106
Author(s):  
Sumandeep Kaur ◽  
Vaibhav Katyal ◽  
Vaishakh Plakkot ◽  
Nisha Deopa ◽  
Aman Prasad ◽  
...  
Luminescence ◽  
2017 ◽  
Vol 33 (3) ◽  
pp. 486-494 ◽  
Author(s):  
B. Naveen Kumar Reddy ◽  
S. Sailaja ◽  
K. Thyagarajan ◽  
Young Dahl Jho ◽  
B. Sudhakar Reddy

2012 ◽  
Vol 53 (6) ◽  
pp. 1069-1074 ◽  
Author(s):  
Mitsuharu Shiwa ◽  
Hiroyuki Masuda ◽  
Hisashi Yamawaki ◽  
Kaita Ito ◽  
Manabu Enoki

2018 ◽  
Vol 84 (11) ◽  
pp. 9-14
Author(s):  
E. S. Koshel ◽  
V. B. Baranovskaya ◽  
M. S. Doronina

The analytical capabilities of arc atomic emission determination of As, Bi, Sb, Cu, Te in rare earth metals (REM) and their oxides after preparatory group concentration using S,N-containing heterochain polymer sorbent are studied on a high-resolution spectrometer “Grand- Extra” (“WMC-Optoelectron-ics” company, Russia). Sorption kinetics and dependence of the degree of the impurity extraction on the solution acidity are analyzed to specify conditions of sorption concentration. To optimize the procedure of arc atomic emission determination of As, Bi, Sb, Cu, and Te various schemes of their sorption preconcentration and subsequent processing of the resulted concentrate with the addition of a collector at different stages of the sorption process have been considered. Graphite powder is used as a collector in analysis of rare earth oxides due to universality and relative simplicity of the emission spectrum. Conditions of analysis and parameters of the spectrometer that affect the analytical signal (mass and composition of the sample, shape and size of the electrodes, current intensity and generator operation mode, interelectrode spacing, wavelengths of the analytical lines) are chosen. The evaporation curves of the determinable impurities were studied and the exposure time of As, Bi, Sb, Cu, and Te in the resulted sorption concentrate was determined. Correctness of the obtained results was evaluated using standard samples of the composition and in comparisons between methods. The results of the study are used to develop a method of arc chemical-atomic emission analysis of yttrium, gadolinium, neodymium, europium, scandium and their oxides in a concentration range of n x (10-2 - 10-5) wt.%.


Author(s):  
Mehrdad Mahanpour ◽  
Andy Gray ◽  
Jose Hulog ◽  
Pat Chang

Abstract C4 (Controlled Collapse Chip Connection) failure analysis compared to conventional packages (DIP- LCC- QFP, etc.) is not trivial. For instance, one has to thin the C4 die for IR microscope inspection or for photon emission analysis. Then, after failure analysis on the die, it must be removed for deprocessing or further analysis. Three methods and techniques will be discussed for removing the C4 die from the package without damaging the die. However, for each technique it is very important to know the condition of the die and package prior to die removal. The method used will differ, for example, if the die is thinned or not.


Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.


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